Three characterization techniques coupled with adsorption for studying the nanoporosity of supported films and membranes

Microporous and Mesoporous Materials

Volumn 111, Issue 1-3, 2008, Pages 417-428

  Rouessac, Vincent ^a   van der Lee, Arie ^a   Bosc, Florence ^a   Durand, Jean ^a   Ayral, André ^a  

^a INSTITUT CHARLES GERHARDT   (France)

Author keywords

Adsorption desorption isotherms at room temperature; Coupled methods; Ellipsometry; Quartz crystal microbalance; X ray reflectometry

Indexed keywords

CONDENSATION; ELLIPSOMETRY; QUARTZ CRYSTAL MICROBALANCES; THERMAL EFFECTS;

ADSORPTION-DESORPTION ISOTHERMS; COUPLED METHODS; ROOM TEMPERATURE; X-RAY REFLECTOMETRY;

NANOSTRUCTURED MATERIALS;

CONDENSATION; ELLIPSOMETRY; NANOSTRUCTURED MATERIALS; QUARTZ CRYSTAL MICROBALANCES; THERMAL EFFECTS;

EID: 41649102014     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micromeso.2007.08.033     Document Type: Article

References (57)

1. Sun J., Hu Y., Frieze W., and Gidley D. Radiat. Phys. Chem. 68 (2003) 345
2. He C., Muramatsu M., Ohdaira T., Oshima N., Kinomura A., Suzuki R., and Kobayashi Y. Radiat. Phys. Chem. 76 (2007) 204
3. Vogt D., Lee H.-J., Wu W., and Liu Y. J. Phys. Chem. B 109 (2005) 18445
4. Hedden R., Lee H.-J., Soles C., and Bauer B. Langmuir 20 (2004) 6658
5. Sauerbrey G. Z. Phys. 155 (1959) 206
6. Warner A.W., and Stockbridge C.D. In: Behrndt K.H. (Ed). Vacuum Microbalance Technique vol. 3 (1963), Plenum Press, New York 55-73
7. Mecea V.M. Sensors Actuat. A 128 (2006) 270
8. Michalzik M., Wilke R., and Büttgenbach S. Sensors Actuat. B: Chem. 111-112 (2005) 410
9. Passamano M., and Pighini M. Sensors Actuat. B: Chem. 118 (2006) 177
10. Zeng H., Jiang Y., Xie G., and Yu J. Sensors Actuat. B: Chem. 122 (2007) 1
11. Lukaszewski M., and Zerwinski A. J. Electroanal. Chem. 589 (2006) 87
12. Fu Y., and Finklea H. Anal. Chem. 75 (2003) 5387
13. A. Holloway, A. Nabok, M. Thompson, J. Siddiqi, A. Ray, V. Bliznyuk, in: Proceedings of the 3rd IEEE Conference on Sensors 3, 2004, 1500.
14. Yeatman E., Green M., Dawnay E., Fardad M., and Horowitz F. J. Sol-Gel Sci. Technol. 2 (1994) 711
15. Baklanov M., Mogilnikov K., Polovinkin V., and Dultsev F. J. Vac. Sci. Technol. B 18 (2000) 1385
16. Bourgeois A., Brunet Bruneau A., Jousseaume V., Rochat N., Fisson S., Demarets B., and Rivory J. Thin Solid Films 455-456 (2004) 366
17. Favennec L., Jousseaume V., Rouessac V., Fusalba F., Durand J., and Passemard G. Mater. Sci. Semicond. Proc. 7 (2004) 277-282
18. Wongmanerod C., Zangooie S., and Arwin H. Appl. Surf. Sci. 172 (2001) 117
19. Rouessac V., Coustel R., Bosc F., Durand J., and Ayral A. Thin Solid Films 495 (2006) 232
20. Elbs H., and Krausch G. Polymers 45 (2004) 7935
21. Sirard S., Ziegler K., Sanchez I., Green P., and Johnston K. Macromolecules 35 (2002) 1928
22. Tang Y., Lu J., Lewis A., Vick T., and Stratford P. Macromolecules 35 (2002) 3955
23. Chen W.-L., Shull K., Papatheodorou T., Styrkas D., and Keddie J. Macromolecules 32 (1999) 136
24. Miyazaki T., Shimazu A., Matsushita T., and Ikeda K.-I. J. Appl. Polym. Sci. 78 (2000) 1818
25. Hedden R.C., Lee H.-J., Soles C.L., and Bauer B.J. Langmuir 20 (2004) 6658
26. Vogt B.D., Pai R.A., Lee H.-J., Hedden R.C., Soles C.L., Wu W.-L., Lin E.K., Bauer B.J., and Watkins J.J. Chem. Mater. 17 (2005) 1398
27. Klotz M., Rouessac V., Rébiscoul D., Ayral A., and van der Lee A. Thin Solid Films 495 (2006) 214
28. Dourdain S., Mehdi A., Bardeau J.F., and Gibaud A. Thin Solid Films 495 (2006) 205
29. Als-Nielsen J., and McMorrow D. Elements of Modern X-ray Physics (2001), John Wiley and Sons, Ltd, Chichester, England
30. Parrat L.G. Phys. Rev. 95 (1954) 359
31. Dourdain S., and Gibaud A. Appl. Phys. Lett. 87 (2005) 223105
32. Klotz M., Idrissi-Kandri N., Ayral A., van der Lee A., and Guizard C. J. Phys. IV France 12 (2002) Pr6-Pr283
33. Albouy P.-A., and Ayral A. Chem. Mater. 14 (2002) 3391
34. Emmett P., and Brunauer S. J. Am. Chem. Soc. 59 (1937) 1553
35. V. Monnier, Ph.D thesis, University of Grenoble, France, 2006.
36. Brunauer S., Dening L.S., Dening W.E., and Teller E.J. J. Am. Chem. Soc. 62 (1940) 1723
37. Mikhail R., Brunauer S., and Bodor E. J. Coll. Interf. Sci. 26 (1968) 45-53
38. Boissière C., Grosso D., Lepoutre S., Nicole L., Brunet Bruneau A., and Sanchez C. Langmuir 21 (2005) 12362
39. Brunauer S., Emmett P., and Teller E. J. Am. Chem. Soc. 60 (1938) 309
40. Hagymassy J., Brunauer S., and Mikhail R. J. Coll. Interf. Sci. 29 (1969) 485-491
41. Mikhail R., Selim S., and Shebl F. Egyp. J. Chem. 19 (1978) 405 Volume Date 1976
42. Naono H., Hakuman M., and Nakai K. J. Coll. Interf. Sci. 165 (1994) 532
43. Mogilnikov K., and Baklanov M. Electrochem. Solid State Lett. 5 (2002) F29
44. Mahajan A., Patil L., Bange J., and Gautam D.K. Surf. Coat. Technol. 183 (2004) 295
45. Heidsieck H. Surf. Coat. Technol. 112 (1999) 324
46. Richards D., Bloomfield M., Soukane S., and Cale T. Vacuum 59 (2000) 168
47. Rouessac V., Tuluc P., and Durand J. J. Membr. Sci. 230 (2004) 49
48. Novikov N., Gontar A., Khandozhko S., Kutsay A., Tkach V., Gorokhov V., Belitsky G., and Vasin A. Diam. Relat. Mat. 9 (2000) 792
49. Li Y., and Shimada S. Surf. Coat. Technol. 201 (2006) 1160
50. L. Favennec, Ph.D thesis, University of Montpellier 2, France, 2005.
51. Sirard S., Green P., and Johnston K. J. Phys. Chem. B 105 (2001) 766
52. Rehfeldt F., and Tanaka M. Langmuir 18 (2002) 4908
53. Botzung-Appert E., Monnier V., Ha Duong T., Pansu R., and Ibanez A. Chem. Mater. 16 (2004) 1609
54. Bosc F., Ayral A., Albouy P.-A., and Guizard C. Chem. Mater. 15 (2003) 2463
55. Bosc F., Ayral A., Albouy P.-A., Datas L., and Guizard C. Chem. Mater. 16 (2004) 2208
56. Puyrenier W., Rouessac V., Broussous L., Rébiscoul D., and Ayral A. Microelectron. Eng. 83 (2006) 2314
57. W. Puyrenier, V. Rouessac, L. Broussous, D. Rébiscoul, A. Ayral, Micropor. Mesopor. Mat. 2007. Available on www.sciencedirect.com.