Spectroscopic ellipsometry investigation of the swelling of poly(dimethylsiloxane) thin films with high pressure carbon dioxide

Journal of Physical Chemistry B

Volumn 105, Issue 4, 2001, Pages 766-772

  Sirard, S M ^a   Green, P F ^a   Johnston, K P ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; ELLIPSOMETRY; HIGH PRESSURE EFFECTS; REFRACTIVE INDEX; SILICON WAFERS; SORPTION; SPECTROSCOPIC ANALYSIS;

POLYDIMETHYLSILIOXANES;

PLASTIC FILMS;

EID: 0034817707     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp002592d     Document Type: Article

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