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Volumn , Issue , 2004, Pages 419-432

Designing and testing fault-tolerant techniques for SRAM-based FPGAs

Author keywords

Fault tolerance; FPGA

Indexed keywords

CHARGED PARTICLES; CMOS INTEGRATED CIRCUITS; ELECTROMAGNETIC WAVES; FAULT TOLERANT COMPUTER SYSTEMS; FIELD PROGRAMMABLE GATE ARRAYS; HIGH ENERGY PHYSICS; INTEGRATED CIRCUITS; IONIZATION; MAGNETOSPHERE; MICROPROCESSOR CHIPS; PROBLEM SOLVING; SEMICONDUCTOR MATERIALS; STATIC RANDOM ACCESS STORAGE;

EID: 4143130035     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/977091.977150     Document Type: Conference Paper
Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.