Current single event effects and radiation damage results for candidate spacecraft electronics

IEEE Radiation Effects Data Workshop

Volumn 2002-January, Issue , 2002, Pages 82-105

  O'Bryan, M V ^a   LaBel, K A ^b   Ladbury, R L ^c   Poivey, C ^d   Howard, J W ^e   Reed, R A ^b   Kniffin, S D ^c   Buchner, S P ^f   Bings, J P ^g   Titus, J L ^g   Clark, S D ^g   Turflinger, T L ^g   Seidleck, C M ^a   Marshall, C J ^b   Marshall, P W ^h   Kim, H S ^e   Hawkins, D K ^b   Carts, M A ^a   Forney, J D ^e   Jones, M R ^c   Sanders, A B ^b   Irwin, T L ^f   Cox, S R ^b   Kahric, Z A ^f   Palor, C D ^c   Sciarini, J A ^c   more..

^a RAYTHEON COMPANY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c NORTHROP GRUMMAN CORPORATION   (United States)

^d SGT INC   (United States)

^e Jackson and Tull Chartered Engineers   (United States)

^f QSS GROUP INC   (United States)

^g NAVAL SURFACE WARFARE CENTER   (United States)

^h NONE

Author keywords

Aerospace electronics; Analog digital conversion; Cyclotrons; NASA; Protons; Single event upset; Space technology; Space vehicles; Telephony; Testing

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CYCLOTRONS; DC-DC CONVERTERS; DIGITAL DEVICES; DIGITAL TO ANALOG CONVERSION; ELECTRIC INVERTERS; FLASH MEMORY; HEAVY IONS; IONIZING RADIATION; NASA; PROTONS; RADIATION DAMAGE; RADIATION HARDENING; SPACECRAFT; TESTING;

AEROSPACE ELECTRONICS; SINGLE EVENT UPSETS; SPACE TECHNOLOGIES; SPACE VEHICLES; TELEPHONY;

RADIATION EFFECTS;

EID: 0037939810     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045537     Document Type: Conference Paper

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