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Volumn 516, Issue 12, 2008, Pages 4258-4266

Chemical formation of palladium-free surface-nickelized polyimide film for flexible electronics

Author keywords

Flexible electronics; Nickel electroless deposition; Polyimide

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTROLESS PLATING; HYDROLYSIS; ION EXCHANGE; POLYIMIDES; SCANNING ELECTRON MICROSCOPY;

EID: 40849106259     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.166     Document Type: Article
Times cited : (50)

References (33)
  • 32
    • 40849118693 scopus 로고    scopus 로고
    • ASTM D3359-95 standard method for measuring adhesion by tape test, Annual Book of ASTM Standards, vol. 06.01.
    • ASTM D3359-95 standard method for measuring adhesion by tape test, Annual Book of ASTM Standards, vol. 06.01.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.