-
1
-
-
0000281585
-
-
Tanahashi, I.; Yoshida, M.; Manabe, Y.; Tohda, T. Surf. Rev. Lett. 1996, 3, 1071.
-
(1996)
Surf. Rev. Lett.
, vol.3
, pp. 1071
-
-
Tanahashi, I.1
Yoshida, M.2
Manabe, Y.3
Tohda, T.4
-
2
-
-
18744373590
-
-
De Marchi, G.; Mattei, G.; Mazzoldi, P.; Sada, C.; Miotello, A. J. Appl. Phys. 2002, 92, 4249.
-
(2002)
J. Appl. Phys.
, vol.92
, pp. 4249
-
-
De Marchi, G.1
Mattei, G.2
Mazzoldi, P.3
Sada, C.4
Miotello, A.5
-
3
-
-
2942641490
-
-
Wiley-VCH: Weinheim, Germany
-
Nanocomposite Science and Technology; Ajayan, P. M., Schadler, L. S., Braun, P. V., Eds.; Wiley-VCH: Weinheim, Germany, 2003; p 1.
-
(2003)
Nanocomposite Science and Technology
, pp. 1
-
-
Ajayan, P.M.1
Schadler, L.S.2
Braun, P.V.3
-
4
-
-
0032655056
-
-
Dirix, Y.; Bastiaansen, C.; Caseri, W.; Smith, P. J. Mater. Sci. 1999, 34, 3859.
-
(1999)
J. Mater. Sci.
, vol.34
, pp. 3859
-
-
Dirix, Y.1
Bastiaansen, C.2
Caseri, W.3
Smith, P.4
-
8
-
-
0028397660
-
-
Lamber, R.; Baalmann, A.; Jaeger, N. I.; Schulz-Ekloff, G.; Wetjen, S. Adv. Mater. 1994, 6, 223.
-
(1994)
Adv. Mater.
, vol.6
, pp. 223
-
-
Lamber, R.1
Baalmann, A.2
Jaeger, N.I.3
Schulz-Ekloff, G.4
Wetjen, S.5
-
9
-
-
0028761021
-
-
Comita, P. B.; Kay, E.; Zhang, R.; Jacob, W. Appl. Surf. Sci. 1994, 79/80, 196.
-
(1994)
Appl. Surf. Sci.
, vol.79-80
, pp. 196
-
-
Comita, P.B.1
Kay, E.2
Zhang, R.3
Jacob, W.4
-
11
-
-
0037117913
-
-
Wang, T. C.; Rubner, M. F.; Cohen, R. E. Langmuir 2002, 18, 3370.
-
(2002)
Langmuir
, vol.18
, pp. 3370
-
-
Wang, T.C.1
Rubner, M.F.2
Cohen, R.E.3
-
12
-
-
0037435601
-
-
Wang, T. C.; Rubner, M. F.; Cohen, R. E. Chem. Mater. 2003, 15, 299.
-
(2003)
Chem. Mater.
, vol.15
, pp. 299
-
-
Wang, T.C.1
Rubner, M.F.2
Cohen, R.E.3
-
13
-
-
0031275608
-
-
Rosolovsky, J.; Bogges, R. K.; Rubira, A. F.; Taylor, L. T.; Stoakley, D. M.; St. Clair, A. K. J. Mater. Res. 1997, 12, 3127.
-
(1997)
J. Mater. Res.
, vol.12
, pp. 3127
-
-
Rosolovsky, J.1
Bogges, R.K.2
Rubira, A.F.3
Taylor, L.T.4
Stoakley, D.M.5
St. Clair, A.K.6
-
14
-
-
0001546373
-
-
Southward, R. E.; Thompson, D. W.; St. Clair, A. K. Chem. Mater. 1997, 9, 501.
-
(1997)
Chem. Mater.
, vol.9
, pp. 501
-
-
Southward, R.E.1
Thompson, D.W.2
St. Clair, A.K.3
-
15
-
-
0036122181
-
-
Thompson, D. S.; Thompson, D. W.; Southward, R. E. Chem. Mater. 2002, 14, 30.
-
(2002)
Chem. Mater.
, vol.14
, pp. 30
-
-
Thompson, D.S.1
Thompson, D.W.2
Southward, R.E.3
-
16
-
-
0000686071
-
-
Sawada, T.; Ando, S.; Sasaki, S. Appl. Phys. Lett. 1999, 74, 938.
-
(1999)
Appl. Phys. Lett.
, vol.74
, pp. 938
-
-
Sawada, T.1
Ando, S.2
Sasaki, S.3
-
18
-
-
0035662262
-
-
Ikeda, S.; Akamatsu, K.; Nawafune, H. J. Mater. Chem. 2001, 11, 2919.
-
(2001)
J. Mater. Chem.
, vol.11
, pp. 2919
-
-
Ikeda, S.1
Akamatsu, K.2
Nawafune, H.3
-
19
-
-
0344514054
-
-
Akamatsu, K.; Ikeda, S.; Nawafune, H. Langmuir 2003, 19, 10366.
-
(2003)
Langmuir
, vol.19
, pp. 10366
-
-
Akamatsu, K.1
Ikeda, S.2
Nawafune, H.3
-
20
-
-
0038036094
-
-
Akamatsu, K.; Ikeda, S.; Nawafune, H.; Deki, S. Chem. Mater. 2003, 15, 2488.
-
(2003)
Chem. Mater.
, vol.15
, pp. 2488
-
-
Akamatsu, K.1
Ikeda, S.2
Nawafune, H.3
Deki, S.4
-
21
-
-
84953683183
-
-
Haight, R.; White, R. C.; Silverman, P. S.; Ho, P. S. J. Vac. Sci. Technol., A 1988, 6, 2188.
-
(1988)
J. Vac. Sci. Technol., A
, vol.6
, pp. 2188
-
-
Haight, R.1
White, R.C.2
Silverman, P.S.3
Ho, P.S.4
-
22
-
-
0032022235
-
-
Faupel, F.; Willecke, R.; Thran, A. Mater. Sci. Eng. R 1998, 22, 1.
-
(1998)
Mater. Sci. Eng. R
, vol.22
, pp. 1
-
-
Faupel, F.1
Willecke, R.2
Thran, A.3
-
23
-
-
6444233387
-
-
note
-
In the absence of oxygen, metallic Cu is not dissolved in hydrochloric acid solution.
-
-
-
-
24
-
-
26744474151
-
-
Lee, K. W.; Kowalczyk, S. P.; Shaw, J. M. Langmuir 1991, 7, 2450.
-
(1991)
Langmuir
, vol.7
, pp. 2450
-
-
Lee, K.W.1
Kowalczyk, S.P.2
Shaw, J.M.3
-
26
-
-
0000133573
-
-
Stoffel, N. C.; Hsieh, M.; Chandra, S.; Kramer, E. J. Chem. Mater. 1996, 8, 1035.
-
(1996)
Chem. Mater.
, vol.8
, pp. 1035
-
-
Stoffel, N.C.1
Hsieh, M.2
Chandra, S.3
Kramer, E.J.4
-
27
-
-
0037659704
-
-
Huang, X. D.; Bhangale, S. M.; Moran, P. M.; Yakovlev, N. L.; Pan, J. Polym. Int. 2003, 52, 1064.
-
(2003)
Polym. Int.
, vol.52
, pp. 1064
-
-
Huang, X.D.1
Bhangale, S.M.2
Moran, P.M.3
Yakovlev, N.L.4
Pan, J.5
-
28
-
-
0024769639
-
-
Snyder, R. W.; Thomson, B.; Bartges, B.; Czerniawski, D.; Painter, P. C. Macromolecules 1989, 22, 4166.
-
(1989)
Macromolecules
, vol.22
, pp. 4166
-
-
Snyder, R.W.1
Thomson, B.2
Bartges, B.3
Czerniawski, D.4
Painter, P.C.5
-
29
-
-
0024681097
-
-
Linde, H. G.; Gleason, R. T. J. Polym. Sci., B: Polym. Phys. 1989, 26, 1485.
-
(1989)
J. Polym. Sci., B: Polym. Phys.
, vol.26
, pp. 1485
-
-
Linde, H.G.1
Gleason, R.T.2
-
31
-
-
0000402631
-
-
We have measured time course of UV-vis spectra at room temperature for films obtained from fully doped precursors (see Supporting Information, Figure S1). The results imply that the copper nanoparticles with smallest size studied were not so stable against oxidation because spectral shift occurred within few hours. This shift can occur through oxidation as reported by literature. See Clay, R. T.; Cohen R. E. New J. Chem. 1998, 22, 745.
-
(1998)
New J. Chem.
, vol.22
, pp. 745
-
-
Clay, R.T.1
Cohen, R.E.2
-
32
-
-
6444227312
-
-
note
-
The number of particles was counted in at least three regions and the average value was employed. Thickness of the thin cross section was determined by microtoming, however, it was further confirmed by AFM measurements of the bump between the film and the silicon substrate on which the cross sections were mounted. The average section thickness was observed to be 50 nm with an error of 5 nm for all samples.
-
-
-
-
33
-
-
6444235437
-
-
note
-
The low emission current was necessary for nanobeam EDX analysis to ensure the minimum dose for polyimide resins. No distinct damage was observed after the present analysis with an accumulation time of 180 s.
-
-
-
-
34
-
-
0003659464
-
-
Springer-Verlag; Berlin
-
It is theoretically predicted that in general, increase in particle size and decrease in interparticle distance result in red shift of the plasmon peak position. In the present system, the interparticle distance between copper nanoparticles is almost constant so that particle-to-particle interaction is thought to be not so important. Therefore, we believe that the changes in the absorption spectra with annealing can be due to increase in copper nanoparticle size. For theoretical description, see Optical Properties of Metal Clusters, Kreibig, U., Vollmer, M., Eds.; Springer-Verlag; Berlin, 1995.
-
(1995)
Optical Properties of Metal Clusters
-
-
Kreibig, U.1
Vollmer, M.2
-
35
-
-
6444227974
-
-
note
-
g of polyimide near the particle surface changes because of relatively small volume fraction of copper in polyimide (0.5-4%).
-
-
-
-
38
-
-
0034323529
-
-
Lisiecki, I.; Sack-Kongehl, H.; Weiss, K.; Urban, J.; Pileni, M.-P. Langmuir 2000, 16, 8802.
-
(2000)
Langmuir
, vol.16
, pp. 8802
-
-
Lisiecki, I.1
Sack-Kongehl, H.2
Weiss, K.3
Urban, J.4
Pileni, M.-P.5
-
39
-
-
0034319479
-
-
Lisiecki, I.; Sack-Kongehl, H.; Weiss, K.; Urban, J.; Pileni, M.-P. Langmuir 2000, 16, 8807.
-
(2000)
Langmuir
, vol.16
, pp. 8807
-
-
Lisiecki, I.1
Sack-Kongehl, H.2
Weiss, K.3
Urban, J.4
Pileni, M.-P.5
-
40
-
-
0032207612
-
-
Kiene, M.; Strunskus, T.; Peter, R.; Faupel, F. Adv. Mater. 1998, 10, 1357.
-
(1998)
Adv. Mater.
, vol.10
, pp. 1357
-
-
Kiene, M.1
Strunskus, T.2
Peter, R.3
Faupel, F.4
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