Manipulating nanoparticle size within polyelectrolyte multilayers via electroless nickel deposition

Chemistry of Materials

Volumn 15, Issue 1, 2003, Pages 299-304

  Wang, Tom C ^a   Rubner, Michael F ^a   Cohen, Robert E ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CARBOXYLIC ACID; FUNCTIONAL GROUP; NICKEL; PALLADIUM; POLY(ALLYLAMINE HYDROCHLORIDE); POLYACRYLIC ACID; POLYELECTROLYTE; POLYMER; TETRAAMINEPALLADIUM; UNCLASSIFIED DRUG;

ARTICLE; CATALYSIS; CHEMICAL BINDING; CHEMICAL COMPOSITION; CHEMISTRY; CONCENTRATION (PARAMETERS); FILM; KINETICS; NANOPARTICLE; PARTICLE SIZE; REDUCTION; SURFACE PROPERTY; THICKNESS;

EID: 0037435601     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm020934h     Document Type: Article

References (37)

1. (a) Decher, G. Science 1997, 277, 1232-1237.
2. (b) Bertrand, P.; Jonas, A.; Laschewsky, A.; Legras, R. Macromol. Rapid Commun. 2000, 21, 319-348.
3. (c) Hammond, P. T. Curr. Opin. Colloid Interface Sci. 2000, 4, 430-442.
4. Joly, S.; Kane, R.; Radzilowski, L.; Wang, T.; Wu, A.; Cohen, R. E.; Thomas, E. L.; Rubner, M. F. Langmuir 2000, 16, 1354-1359.
5. Dutta, A. K.; Ho, T.; Zhang, L.; Stroeve, P. Chem. Mater. 2000, 12, 1042-1048.
6. Liu, J.; Cheng, L.; Song, Y.; Liu, B.; Dong, S. Langmuir 2001, 17, 6747-6750.
7. Dai, J.; Bruening, M. L. Nano Lett. 2002, 2, 497-501.
8. Antipov, A. A.; Sukhorukov, G. B.; Fedutik, Y. A.; Hartmann, J.; Giersig, M.; Möhwald, H. Langmuir 2002, 18, 6687-6693.
9. Wang, T. C.; Rubner, M. F.; Cohen, R. E. Langmuir 2002, 18, 3370-3375.
10. (a) Beecroft, L. L.; Ober, C. K. Chem. Mater. 1997, 9, 1302-1317.
11. (b) Cohen, R. E. Curr. Opin. Solid State Mater. Sci. 1999, 4, 587-590.
12. Murray, C. B.; Norris, D. J.; Bawendi, M. G. J. Am. Chem. Soc. 1993, 115, 8706-8715.
13. Brown, K. R.; Natan, M. J. Langmuir 1998, 14, 726-728.
14. Brown, K. R.; Walter, D. G.; Natan, M. J. Chem. Mater. 2000, 12, 306-313.
15. Jana, N. R.; Gearheart, L.; Murphy, C. J. Chem. Mater. 2001, 13, 2313-2322.
16. Schmid, G.; Lehnert, A.; Malm, J. O.; Bovin, J. O. Angew. Chem., Int. Ed. Engl. 1991, 30, 874-876.
17. Bright, R. M.; Walter, D. G.; Musick, M. D.; Jackson, M. A.; Allison, K. J.; Natan, M. J. Langmuir 1996, 12, 810-817.
18. Yu, H.; Gibbons, P. C.; Kelton, K. F.; Buhro, W. E. J. Am. Chem. Soc. 2001, 123, 9198-9199.
19. Park, J. I.; Cheon, J. J. Am. Chem. Soc. 2001, 123, 5743-5746.
20. Lu, L.; Wang, H.; Xi, S.; Zhang, H. J. Mater. Chem. 2002, 12, 156-158.
21. Riedel, W. Electroless Nickel Plating; Finishing Publications: Metals Park, 1991.
22. Zhang, Y. H.; Yan, T. T.; Yu, S. Q.; Zhuang, S. Y. J. Electrochem. Soc. 1999, 146, 1270-1272.
23. Boontongkong, Y.; Cohen, R. E.; Rubner, M. F. Chem. Mater. 2000, 12, 1628-1633.
24. Deng, T.; Arias, F.; Ismagilov, R. F.; Kenis, P. J. A.; Whitesides, G. M. Anal. Chem. 2000, 72, 645-651.
25. Mendelsohn, J. D.; Barrett, C. J.; Chan, V. V.; Pal, A. J.; Mayes, A. M.; Rubner, M. F. Langmuir 2000, 16, 5017-5023.
26. Dubas, S. T.; Schlenoff, J. B. Langmuir 2001, 17, 7725-7727.
27. The elemental composition within the +Pd/Ni film was also confirmed by EDS analysis on a TEM cross-sectioned sample (Figure 2B) and indicated the presence of Ni and Pd as expected; B was too light for the detector.
28. Lelental, M. J. Electrochem. Soc. 1973, 120, 1650-1654.
29. Safranek, W. H. The Properties of Electrodeposited Metals and Alloys, 2nd ed.; American Electroplaters and Surface Finishers Society: Orlando, 1986.
30. To account for the difference in the amount of polymer, and hence N, probed by XPS between +Pd and +Pd/Ni samples, the reported element ratios for the +Pd/Ni sample were multiplied by the volume fraction of polymer, 0.22, approximated by the ratio of the thicknesses of the two samples.
31. Ferguson, I. F. Auger Microprobe Analysis; Adam Hilger: Bristol, 1989.
32. Yoo, D.; Shiratori, S. S.; Rubner, M. F. Macromolecules 1998, 31, 4309-4318.
33. Shiratori, S. S.; Rubner, M. F. Macromolecules 2000, 33, 4213-4219.
34. Wang, T. C.; Chen, B.; Rubner, M. F.; Cohen, R. E. Langmuir 2001, 17, 6610-6615.
35. Ziolo, R. F.; Giannelis, E. P.; Weinstein, B. A.; O'Horo, M. P.; Ganguly, B. N.; Mehrotra, V.; Russell, M. W.; Huffman, D. R. Science 1992, 257, 219-223.
36. Sohn, B. H.; Cohen, R. E.; Papaefthymiou, G. C. J. Magn. Magn. Mater. 1998, 182, 216-224.
37. Sun, S.; Anders, S.; Hamann, H. F.; Thiele, J.; Baglin, J. E. E.; Thomson, T.; Fullerton, E. E.; Murray, C. B.; Terris, B. D. J. Am. Chem. Soc. 2002, 124, 2884-2885.