New approach for the dynamical simulation of CBED patterns in heavily strained specimens

Ultramicroscopy

Volumn 108, Issue 5, 2008, Pages 426-432

  Houdellier, F ^a   Altibelli, A ^a   Roucau, C ^a   Casanove, M J ^a  

^a CEMES CNRS   (France)

Author keywords

Convergent beam electron diffraction; Dynamical theory of electron diffraction; Strained layers

Indexed keywords

COMPUTER SIMULATION; DIFFRACTION PATTERNS; ELECTRON BEAMS; SCHRODINGER EQUATION;

DYNAMICAL SIMULATION; HEAVILY STRAINED SPECIMENS; STRAINED LAYERS;

ELECTRON DIFFRACTION;

ARTICLE; COMPUTER PROGRAM; CONVERGENT BEAM ELECTRON DIFFRACTION; ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; SIMULATION; TECHNIQUE; THEORY;

EID: 40749117940     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.06.002     Document Type: Article

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