Direct electrical characterization of embedded ferroelectric lead titanate nanoislands

Journal of Applied Physics

Volumn 103, Issue 3, 2008, Pages

  Clemens, S ^a   Dippel, A C ^a   Schneller, T ^a   Waser, R ^a,b   Rudiger A ^b   Rohrig S ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; LEAD COMPOUNDS; SILICON; SUBSTRATES;

COERCIVE FIELD; FERROELECTRIC LEAD TITANATE NANOISLANDS; NONPOLAR MATRIX;

FERROELECTRIC MATERIALS;

EID: 39449138434     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2838346     Document Type: Article

References (20)

1. A. Rüdiger, T. Schneller, A. Roelofs, S. Tiedke, T. Schmitz, and R. Waser, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 10.1007/s00339-004- 3167-z 80, 1247 (2005).
2. S. Clemens, T. Schneller, A. v. d. Hart, F. Peter, and R. Waser, Adv. Mater. (Weinheim, Ger.) ADVMEW 0935-9648 10.1002/adma.200401695 17, 1357 (2005).
3. S. K. Lee, W. Lee, M. Alexe, K. Nielsch, D. Hesse, and U. Gösele, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1899239 86, 152906 (2005).
4. W. Ma, C. Harnagea, D. Hesse, and U. Gösele, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1625106 83, 3770 (2003).
5. C. Harnagea, M. Alexe, J. Schilling, J. Choi, R. B. Wehrspohn, D. Hesse, and U. Gösele, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1606870 83, 1827 (2003).
6. S. Kronholz, S. Rathgeber, S. Karthäuser, H. Kohlstedt, S. Clemens, and T. Schneller, Adv. Funct. Mater. AFMDC6 1616-301X 10.1002/adfm.200600384 16, 2346 (2006).
7. S. V. Kalinin, A. Rar, and S. Jesse, IEEE Trans. Ultrason. Ferroelectr. Freq. Control ITUCER 0885-3010 10.1109/TUFFC.2006.169 53, 2226 (2006).
8. C. S. Ganpule, A. Stanishevsky, S. Aggarwal, J. Melngailis, E. Williams, and R. Ramesh, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.125485 75, 3874 (1999).
9. C. S. Ganpule, A. Stanishevsky, Q. Su, S. Aggarwal, J. Melngailis, E. Williams, and R. Ramesh, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.124391 75, 409 (1999).
10. T. Schmitz, K. Prume, B. Reichenberg, A. Roelofs, R. Waser, and S. Tiedke, J. Eur. Ceram. Soc. JECSER 0955-2219 10.1016/S0955-2219(03)00583-1 24, 1145 (2004).
11. S. Tiedke, T. Schmitz, K. Prume, A. Roelofs, T. Schneller, U. Kall, R. Waser, C. S. Ganpule, V. Nagarajan, A. Stanishevsky, and R. Ramesh, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1421638 79, 3678 (2001).
12. S. Clemens, T. Schneller, A. Rüdiger, F. Peter, S. Kronholz, T. Schmitz, S. Tiedke, and R. Waser, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2084322 87, 142904 (2005).
13. R. Waser, T. Schneller, S. Hoffmann-Eifert, and P. Ehrhart, Integr. Ferroelectr. IFEREU 1058-4587 10.1080/10584580108015524 36, 3 (2001).
14. R. W. Schwartz, T. Schneller, and R. Waser, C. R. Chim. CRCOCR 1631-0748 10.1016/j.crci.2004.01.007 7, 433 (2004).
15. Supplied as FOx-12 (flowable oxide), Dow Corning Inc.
16. Supplied as Accuglas T-11, Honeywell Inc.
17. MasterTex synthetic polishing pad, Buehler GmbH, Germany.
18. A.-C. Dippel, T. Schneller, and R. Waser (unpublished).
19. K. Maex, M. R. Baklanov, D. Shamiryan, F. Iacopi, S. H. Brongersma, and Z. S. Yanovitskaya, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1567460 93, 8793 (2003).
20. R. Meyer, R. Waser, K. Prume, T. Schmitz, and S. Tiedke, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1897425 86, 142907 (2005).