Dynamic leakage current compensation in ferroelectric thin-film capacitor structures

Applied Physics Letters

Volumn 86, Issue 14, 2005, Pages 1-3

  Meyer, Reń ^a   Waser, Rainer ^a   Prume, Klaus ^b   Schmitz, Torsten ^b   Tiedke, Stephan ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b AIXACCT SYSTEMS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; FREQUENCIES; HYSTERESIS; LEAKAGE CURRENTS; OHMIC CONTACTS; POLARIZATION; SWITCHING;

CAPACITOR STRUCTURES; CURRENT COMPENSATION; HYSTERESIS LOOP; SWITCHING CURRENT;

FERROELECTRIC THIN FILMS;

EID: 17444425671     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1897425     Document Type: Article

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