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Volumn 103, Issue 3, 2008, Pages

Ferroelectric and fatigue behavior of Pb(Zr0.52 Ti 0.48)O3/(Bi3.15Nd0.85)Ti 3O12 bilayered thin films

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; POLARIZATION; SOL-GELS; SPUTTERING; THIN FILMS;

EID: 39349083531     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2838333     Document Type: Article
Times cited : (23)

References (39)
  • 1
    • 35348846979 scopus 로고
    • SCIEAS 0036-8075 10.1126/science.246.4936.1400.
    • J. F. Scott, Science SCIEAS 0036-8075 10.1126/science.246.4936.1400 246, 1400 (1989).
    • (1989) Science , vol.246 , pp. 1400
    • Scott, J.F.1
  • 3
    • 0000195589 scopus 로고    scopus 로고
    • RPPHAG 0034-4885 10.1088/0034-4885/61/9/002.
    • D. Damjanovic, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/61/9/ 002 61, 1267 (1998).
    • (1998) Rep. Prog. Phys. , vol.61 , pp. 1267
    • Damjanovic, D.1
  • 5
    • 2342590171 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1655678.
    • D. Wu, A. Li, and N. Ming, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1655678 95, 4275 (2004).
    • (2004) J. Appl. Phys. , vol.95 , pp. 4275
    • Wu, D.1    Li, A.2    Ming, N.3
  • 10
    • 0001108933 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.125938.
    • M. Dawber and J. F. Scott, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.125938 76, 1060 (2000).
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 1060
    • Dawber, M.1    Scott, J.F.2
  • 14
    • 0242403954 scopus 로고
    • SCIEAS 0036-8075 10.1126/science.113.2943.591.
    • B. T. Matthias, Science SCIEAS 0036-8075 10.1126/science.113.2943.591 113, 591 (1951).
    • (1951) Science , vol.113 , pp. 591
    • Matthias, B.T.1
  • 20
    • 13644279563 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1834986.
    • X. S. Gao, J. M. Xue, and J. Wang, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1834986 97, 034101 (2005).
    • (2005) J. Appl. Phys. , vol.97 , pp. 034101
    • Gao, X.S.1    Xue, J.M.2    Wang, J.3
  • 23
    • 0001515279 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.57.10424.
    • T. Hauke, V. Mueller, and H. Beige, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.10424 57, 10424 (1998).
    • (1998) Phys. Rev. B , vol.57 , pp. 10424
    • Hauke, T.1    Mueller, V.2    Beige, H.3
  • 26
    • 0037018031 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.88.097601.
    • J. Sigman and D. P. Norton, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.88.097601 88, 097601 (2002).
    • (2002) Phys. Rev. Lett. , vol.88 , pp. 097601
    • Sigman, J.1    Norton, D.P.2
  • 31
    • 0026850089 scopus 로고
    • MSBTEK 0921-5107 10.1016/0921-5107(92)90135-V.
    • I. K. Yoo and S. B. Desu, Mater. Sci. Eng., B MSBTEK 0921-5107 10.1016/0921-5107(92)90135-V 13, 319 (1992).
    • (1992) Mater. Sci. Eng., B , vol.13 , pp. 319
    • Yoo, I.K.1    Desu, S.B.2
  • 33
    • 0000838110 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.367953.
    • X. Du and I. W. Chen, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.367953 83, 7789 (1998).
    • (1998) J. Appl. Phys. , vol.83 , pp. 7789
    • Du, X.1    Chen, I.W.2
  • 35
    • 0001764569 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.366006.
    • D. V. Taylor and D. Damjanovic, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.366006 82, 1973 (1997).
    • (1997) J. Appl. Phys. , vol.82 , pp. 1973
    • Taylor, D.V.1    Damjanovic, D.2
  • 36


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