Improvement of the dielectric and ferroelectric properties in superlattice structure of Pb(Zr,Ti)O3 thin films grown by a chemical solution route

Applied Physics Letters

Volumn 84, Issue 26, 2004, Pages 5470-5472

  Pontes, F M ^a   Longo, E ^a   Leite, E R ^a   Varela, J A ^b  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DEPOSITION; FILM GROWTH; LEAD COMPOUNDS; LIGHT POLARIZATION; PEROVSKITE; POLYCRYSTALLINE MATERIALS; REMANENCE; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CHEMICAL SOLUTION ROUTE; HETEROLAYERED MATERIALS; MORPHOTROPIC PHASE BOUNDARY (MPB); PHASE BOUNDARY;

FERROELECTRIC THIN FILMS;

EID: 3242696219     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1751623     Document Type: Article

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