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Volumn 118, Issue 1-3, 2005, Pages 225-228

Switching fatigue of ferroelectric layered-perovskite thin films: Temperature effect

Author keywords

Ferroelectric thin films; Layered perovskite oxides; Switching fatigue

Indexed keywords

DEFECTS; DIELECTRIC PROPERTIES; DIFFUSION; ELECTRODES; FATIGUE OF MATERIALS; PEROVSKITE; REACTION KINETICS; SILICA; SWITCHING;

DOMAIN SWITCHING; FATIGUE REJUVENATION; LAYERED-PEROVKSITE OXIDES; SWITCHING FATIGUE;

FERROELECTRIC THIN FILMS;

EID: 15344343619 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2004.12.034 Document Type: Conference Paper

Times cited : (8)

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