메뉴 건너뛰기




Volumn 19, Issue 4, 2007, Pages 240-244

Ablation and cutting of silicon wafer and micro-mold fabrication using femtosecond laser pulses

Author keywords

Femtosecond laser; Micromachining; Mold; Silicon wafer

Indexed keywords

LASER ABLATION; LASER BEAM CUTTING; MICROFABRICATION; MICROMACHINING; MOLDS; ULTRASHORT PULSES;

EID: 38949193510     PISSN: 1042346X     EISSN: None     Source Type: Journal    
DOI: 10.2351/1.2795754     Document Type: Article
Times cited : (8)

References (12)
  • 1
    • 0037670796 scopus 로고    scopus 로고
    • Ablation and cutting of planar silicon devices using ferntosecond laser pulses
    • N. Baersch, K. Koerber, A. Ostendorf, and K. H. Toenshoff, "Ablation and cutting of planar silicon devices using ferntosecond laser pulses," Appl. Phys. A 77, 237-242 (2003).
    • (2003) Appl. Phys. A , vol.77 , pp. 237-242
    • Baersch, N.1    Koerber, K.2    Ostendorf, A.3    Toenshoff, K.H.4
  • 2
    • 2342501392 scopus 로고    scopus 로고
    • Femtosecond laser micromachining: Current status and applications
    • N. H. Rizvi, "Femtosecond laser micromachining: Current status and applications," RIKEN Rev. 50, 107-112 (2003).
    • (2003) RIKEN Rev , vol.50 , pp. 107-112
    • Rizvi, N.H.1
  • 3
    • 33845671872 scopus 로고    scopus 로고
    • Laser helical drilling of silicon wafers with ns to fs pulses: Scanning electron microscopy and transmission electron microscopy characterization of drilled through-holes
    • J. Kaspar, A. Luft, S. Nolte, M. Will, and E. Beyer, "Laser helical drilling of silicon wafers with ns to fs pulses: Scanning electron microscopy and transmission electron microscopy characterization of drilled through-holes," J. Laser Appl. 18, 85-92 (2006).
    • (2006) J. Laser Appl , vol.18 , pp. 85-92
    • Kaspar, J.1    Luft, A.2    Nolte, S.3    Will, M.4    Beyer, E.5
  • 4
    • 0035362763 scopus 로고    scopus 로고
    • Effect of energy above laser-induced damage thresholds in the micromachining of silicon by femtosecond pulse laser
    • B. K. A. Ngoi, K. Venkatakrishnan, E. N. L. Lim, B. Tan, and L. H. K. Koh, "Effect of energy above laser-induced damage thresholds in the micromachining of silicon by femtosecond pulse laser," Opt. Lasers Eng. 35, 361-369 (2001).
    • (2001) Opt. Lasers Eng , vol.35 , pp. 361-369
    • Ngoi, B.K.A.1    Venkatakrishnan, K.2    Lim, E.N.L.3    Tan, B.4    Koh, L.H.K.5
  • 5
    • 0012027653 scopus 로고    scopus 로고
    • Femto-second laser ablation of silicon-modification thresholds and morphology
    • J. Bonse, S. Baudach, J. Krueger, W. Kautek, and M. Lenzner, "Femto-second laser ablation of silicon-modification thresholds and morphology," Appl. Phys, A 74, 19-25 (2002).
    • (2002) Appl. Phys, A , vol.74 , pp. 19-25
    • Bonse, J.1    Baudach, S.2    Krueger, J.3    Kautek, W.4    Lenzner, M.5
  • 6
    • 17544363244 scopus 로고    scopus 로고
    • Femtosecond laser micromachining of grooves in silicon with 800 nm pulses
    • T. H. R. Crawford, A. Borowiec, and H. K. Haugen, "Femtosecond laser micromachining of grooves in silicon with 800 nm pulses," Appl. Phys. A 80, 1717-1724 (2004).
    • (2004) Appl. Phys. A , vol.80 , pp. 1717-1724
    • Crawford, T.H.R.1    Borowiec, A.2    Haugen, H.K.3
  • 7
    • 18844451762 scopus 로고    scopus 로고
    • STEM (scanning transmission electron microscopy) analysis of femto-second laser pulse induced damage to bulk silicon
    • E. Coyne, J. P. Magee, P. Mannion, G. M. O'Connor, and T. J. Glynn, "STEM (scanning transmission electron microscopy) analysis of femto-second laser pulse induced damage to bulk silicon," Appl. Phys. A 81, 371-378 (2004).
    • (2004) Appl. Phys. A , vol.81 , pp. 371-378
    • Coyne, E.1    Magee, J.P.2    Mannion, P.3    O'Connor, G.M.4    Glynn, T.J.5
  • 8
    • 12144279213 scopus 로고    scopus 로고
    • Ferntosecond versus nanosecond laser machining: Comparison of induced stresses and structural changes in silicon wafers
    • M. S. Amer, M. A. El-Ashry, L. R. Dosser, K. E. Hix, J. F. Maguire, and Bryan Irwin, "Ferntosecond versus nanosecond laser machining: Comparison of induced stresses and structural changes in silicon wafers," Appl. Surf. Sci. 242, 162-167 (2005).
    • (2005) Appl. Surf. Sci , vol.242 , pp. 162-167
    • Amer, M.S.1    El-Ashry, M.A.2    Dosser, L.R.3    Hix, K.E.4    Maguire, J.F.5    Irwin, B.6
  • 9
    • 22144465493 scopus 로고    scopus 로고
    • Laser ablation of silicon in water with nanosecond and femtosecond pulses
    • J. Ren, M. Kelly, and L. Hesselink, "Laser ablation of silicon in water with nanosecond and femtosecond pulses," Opt. Lett. 30, 1740-1742 (2005).
    • (2005) Opt. Lett , vol.30 , pp. 1740-1742
    • Ren, J.1    Kelly, M.2    Hesselink, L.3
  • 10
    • 20344399931 scopus 로고    scopus 로고
    • Femtosecond laser-induced damage morphologies of crystalline silicon by sub-threshold pulses
    • D. V. Tran, H. Y Zheng, Y C. Lam, V. M. Murukeshan, J. C. Chai, and D. E. Hardt, "Femtosecond laser-induced damage morphologies of crystalline silicon by sub-threshold pulses," Opt. Lasers Eng. 43, 977-986 (2005).
    • (2005) Opt. Lasers Eng , vol.43 , pp. 977-986
    • Tran, D.V.1    Zheng, H.Y.2    Lam, Y.C.3    Murukeshan, V.M.4    Chai, J.C.5    Hardt, D.E.6
  • 11
    • 10844278394 scopus 로고    scopus 로고
    • Experimental investigation of ablation efficiency and plasma expansion during femtosecond and nanosecond laser ablation of silicon
    • X. Zeng, X. L. Mao, R. Greif, and R. E. Russo, "Experimental investigation of ablation efficiency and plasma expansion during femtosecond and nanosecond laser ablation of silicon," Appl. Phys. A 80, 237-241 (2004).
    • (2004) Appl. Phys. A , vol.80 , pp. 237-241
    • Zeng, X.1    Mao, X.L.2    Greif, R.3    Russo, R.E.4
  • 12
    • 33646743149 scopus 로고    scopus 로고
    • Efficiency of silicon micromachining by femtosecond laser pulses in ambient air
    • D. J. Hwang and C. P Grigoropoulos, "Efficiency of silicon micromachining by femtosecond laser pulses in ambient air," J. Appl. Phys. 99, 83-101 (2006).
    • (2006) J. Appl. Phys , vol.99 , pp. 83-101
    • Hwang, D.J.1    Grigoropoulos, C.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.