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Volumn 516, Issue 8, 2008, Pages 2050-2057

Performance and quality analysis of Mo-Si multilayers formed by ion-beam and magnetron sputtering for extreme ultraviolet lithography

Author keywords

Interfaces; Multilayers; Optical coatings; Sputtering

Indexed keywords

ION BEAMS; MAGNETRON SPUTTERING; MULTILAYERS; OPTICAL COATINGS; ULTRAVIOLET RADIATION;

EID: 38649107377     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.07.182     Document Type: Article
Times cited : (9)

References (19)
  • 1
    • 38649102946 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, Lithography, 2005 Edition, Semiconductor Industry Association, Texas, 2005, p.24. [http://www.itrs.net/].
    • International Technology Roadmap for Semiconductors, Lithography, 2005 Edition, Semiconductor Industry Association, Texas, 2005, p.24. [http://www.itrs.net/].
  • 6
    • 38649129231 scopus 로고    scopus 로고
    • Specifications for Absorbing Film Stacks and Multilayers on Extreme Ultraviolet Lithography Mask Blanks, Semiconductor Equipment and Materials International, Nov. 2002, SEMI P38-1102. [http://www.semi.org/].
    • Specifications for Absorbing Film Stacks and Multilayers on Extreme Ultraviolet Lithography Mask Blanks, Semiconductor Equipment and Materials International, Nov. 2002, SEMI P38-1102. [http://www.semi.org/].
  • 12
    • 38649091185 scopus 로고    scopus 로고
    • E. Gullikson, X-ray Interactions with Matter, Berkeley, CA, 1995-2004. [http://www.cxro.lbl.gov/] (last time accessed in May, 2006).
    • E. Gullikson, X-ray Interactions with Matter, Berkeley, CA, 1995-2004. [http://www.cxro.lbl.gov/] (last time accessed in May, 2006).
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.