Statistical leakage estimation of double gate FinFET devices considering the width quantization property

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 16, Issue 2, 2008, Pages 206-209

  Gu, Jie ^a   Keane, John ^a   Sapatnekar, Sachin ^a   Kim, Chris H ^a  

^a University of Minnesota   (United States)

Author keywords

Circuit modeling; Integrated circuit (IC) design; Leakage currents

Indexed keywords

LEAKAGE CURRENTS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PRODUCT DESIGN;

CIRCUIT MODELING; FINFET DEVICES;

INTEGRATED CIRCUITS;

EID: 38349114770     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.909809     Document Type: Article

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