메뉴 건너뛰기




Volumn 155, Issue 3, 2008, Pages

Growth behavior of Ni-P film on Fe/Si substrate in an acid electroless plating bath

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLESS PLATING; NANOCRYSTALLINE MATERIALS; NICKEL; REDUCING AGENTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 38349105722     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2826229     Document Type: Article
Times cited : (2)

References (25)
  • 1
    • 0348199253 scopus 로고    scopus 로고
    • Advances in Electronic Packaging, Vol., Advances in Electronic Packaging; Electrical Design, Simulation, and Test, MEMS, Materials and Processing, Modeling and Characteriztion, American Society of Mechanical Engineers, New York.
    • K. W. Paik, Y. D. Jeon, and J. W. Nah, Advances in Electronic Packaging, Vol. 1, Advances in Electronic Packaging; Electrical Design, Simulation, and Test, MEMS, Materials and Processing, Modeling and Characteriztion, p. 177, American Society of Mechanical Engineers, New York (2001).
    • (2001) , vol.1 , pp. 177
    • Paik, K.W.1    Jeon, Y.D.2    Nah, J.W.3
  • 2
    • 0026817894 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2069271.
    • V. M. Dubin, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2069271, 139, 633 (1992).
    • (1992) J. Electrochem. Soc. , vol.139 , pp. 633
    • Dubin, V.M.1
  • 6
    • 38349096390 scopus 로고    scopus 로고
    • Abstract 2534, The Electrochemical Society Meeting Abstracts, Vol., Los Angeles, CA, Oct 16-21.
    • Y. Shacham-Diamand, H. Einati, A. Shanmugasundram, T. Weidman, M. Yoshino, and T. Osaka, Abstract 2534, The Electrochemical Society Meeting Abstracts, Vol. 2005-02, Los Angeles, CA, Oct 16-21, 2005.
    • (2005) , vol.2005 , Issue.2
    • Shacham-Diamand, Y.1    Einati, H.2    Shanmugasundram, A.3    Weidman, T.4    Yoshino, M.5    Osaka, T.6
  • 7
    • 0034205088 scopus 로고    scopus 로고
    • ELCAAV 0013-4686 10.1016/S0013-4686(00)00442-4.
    • N. Takano, D. Niwa, and T. Y. Osaka, Electrochim. Acta ELCAAV 0013-4686 10.1016/S0013-4686(00)00442-4, 45, 3263 (2000).
    • (2000) Electrochim. Acta , vol.45 , pp. 3263
    • Takano, N.1    Niwa, D.2    Osaka, T.Y.3
  • 11
    • 0030205934 scopus 로고    scopus 로고
    • SSTEET 0268-1242 10.1088/0268-1242/11/8/020.
    • S. Dhar and S. Chakrabarti, Semicond. Sci. Technol. SSTEET 0268-1242 10.1088/0268-1242/11/8/020, 11, 1231 (1996).
    • (1996) Semicond. Sci. Technol. , vol.11 , pp. 1231
    • Dhar, S.1    Chakrabarti, S.2
  • 14
    • 33745762186 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/j.tsf.2006.02.013.
    • J. F. Hsu and B. R. Huang, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2006.02.013, 514, 20 (2006).
    • (2006) Thin Solid Films , vol.514 , pp. 20
    • Hsu, J.F.1    Huang, B.R.2
  • 15
  • 22
    • 0033704490 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/S0040-6090(00)00859-2.
    • C. J. Chen and K. L. Lin, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)00859-2, 370, 106 (2000).
    • (2000) Thin Solid Films , vol.370 , pp. 106
    • Chen, C.J.1    Lin, K.L.2
  • 24
    • 0036671567 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/S0040-6090(02)00556-4.
    • J. Y. Song and J. Yu, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(02)00556-4, 415, 167 (2002).
    • (2002) Thin Solid Films , vol.415 , pp. 167
    • Song, J.Y.1    Yu, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.