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Volumn 15, Issue 4, 1997, Pages 1406-1410

Electron beam dot lithography for nanometer-scale tunnel junctions using a double-layered inorganic resist

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Indexed keywords


EID: 0000909739     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589549     Document Type: Article
Times cited : (9)

References (15)
  • 1
    • 0002412043 scopus 로고
    • edited by H. Grabert and M. H. Devoret Plenum, New York
    • D. V. Averin and K. K. Likharev, Single Charge Tunneling, edited by H. Grabert and M. H. Devoret (Plenum, New York, 1992), p. 311.
    • (1992) Single Charge Tunneling , pp. 311
    • Averin, D.V.1    Likharev, K.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.