Investigation of thickness-dependent stress in PbTiO3 thin films

Journal of Applied Physics

Volumn 103, Issue 1, 2008, Pages

  Bartasyte, A ^a   Chaix Pluchery, O ^a   Kreisel, J ^a   Jimenez, C ^a   Weiss, F ^a   Abrutis, A ^b   Saltyte, Z ^b   Boudard, M ^c  

^a MINATEC   (France)

^b VILNIUS UNIVERSITY   (Lithuania)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; FILM THICKNESS; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SAPPHIRE; STRESS RELAXATION; VOLUME FRACTION; X RAY DIFFRACTION;

PULSED LIQUID INJECTION; THICKNESS-DEPENDENT STRESS;

THIN FILMS;

EID: 38149101757     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2821728     Document Type: Article

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