Thickness dependence of stress in lead titanate thin films deposited on Pt-coated Si

Applied Physics Letters

Volumn 77, Issue 10, 2000, Pages 1532-1534

  Fu, Desheng ^a   Ogawa, Takeshi ^a   Suzuki, Hisao ^a   Ishikawa, Kenji ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000555967     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1308061     Document Type: Article

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