Micro-Raman investigation of stress variations in lead titanate films on sapphire

Journal of Applied Physics

Volumn 86, Issue 2, 1999, Pages 828-834

  Dobal, P S ^a   Bhaskar, S ^a   Majumder, S B ^a   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; LEAD COMPOUNDS; MULTILAYERS; PHASE TRANSITIONS; RAMAN SCATTERING; SAPPHIRE; SINGLE CRYSTALS; SOL-GELS; STRESS ANALYSIS; THIN FILMS;

LEAD TITANATE;

DIELECTRIC FILMS;

EID: 0032606527     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370810     Document Type: Article

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