Raman spectroscopy and x-ray diffraction study of PbTiO3 thin films prepared by sol-gel technique

Journal of Applied Physics

Volumn 85, Issue 4, 1999, Pages 2146-2150

  Li, Ai Dong ^a   Wu, Di ^a   Ge, Chuan Zhen ^a   Lü, Peng ^a   Ma, Wen Hui ^a   Zhang, Ming Sheng ^a   Xu, Cun Yi ^b   Zuo, Jian ^b   Ming, Nai Ben ^c,d  

^a NANJING UNIVERSITY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c CCAST WORLD LABORATORY   (China)

^d Center for Advanced Studies in Science and Technology of Microstructures   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS; CRYSTAL STRUCTURE; CRYSTALLIZATION; FILM PREPARATION; METHANOL; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; TEMPERATURE; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

CONDENSATION POLYMERIZATION; LEAD TITANATE; SOL-GEL TECHNIQUE;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0033556890     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369516     Document Type: Article

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