Characterization of a molecular sieve coating using ellipsometric porosimetry

Langmuir

Volumn 23, Issue 26, 2007, Pages 12811-12816

  Eslava, Salvador ^a,b   Baklanov, Mikhail R ^a   Kirschhock, Christine E A ^b   Iacopi, Francesca ^a   Aldea, Steliana ^b   Maex, Karen ^a,b   Martens, Johan A ^b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ADSORPTION ISOTHERMS; ELLIPSOMETRY; METHANOL; PORE STRUCTURE; TOLUENE;

MOLECULAR ACCESSIBILITY; PLANARIZATION POLISHING;

MOLECULAR SIEVES;

EID: 38049131856     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la7028388     Document Type: Article

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