-
1
-
-
0038534536
-
Theory of threading edge and screw dislocations in GaN
-
Elsner J., Jones R., Sitch P.K., Porezag V.D., Elstner M., Frauenheim Th., et al. Theory of threading edge and screw dislocations in GaN. Phys Rev Lett 79 19 (1997) 3672-3675
-
(1997)
Phys Rev Lett
, vol.79
, Issue.19
, pp. 3672-3675
-
-
Elsner, J.1
Jones, R.2
Sitch, P.K.3
Porezag, V.D.4
Elstner, M.5
Frauenheim, Th.6
-
2
-
-
0000100475
-
Electrical characterization of GaN p-n junctions with and without threading dislocations
-
Kozodoy P., Ibbetson J.P., Marchand H., Fini P., Keller S., Speck J.S., et al. Electrical characterization of GaN p-n junctions with and without threading dislocations. Appl Phys Lett 73 7 (1998) 975-977
-
(1998)
Appl Phys Lett
, vol.73
, Issue.7
, pp. 975-977
-
-
Kozodoy, P.1
Ibbetson, J.P.2
Marchand, H.3
Fini, P.4
Keller, S.5
Speck, J.S.6
-
3
-
-
0032614963
-
Direct observation of localized high current densities in GaN films
-
Brazel E.G., Chin M.A., and Narayanamurti V. Direct observation of localized high current densities in GaN films. Appl Phys Lett 74 16 (1999) 2367-2369
-
(1999)
Appl Phys Lett
, vol.74
, Issue.16
, pp. 2367-2369
-
-
Brazel, E.G.1
Chin, M.A.2
Narayanamurti, V.3
-
4
-
-
0042512254
-
Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride
-
Simpkins B.S., Yu E.T., Waltereit P., and Speck J.S. Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride. J Appl Phys 94 3 (2003) 1448-1453
-
(2003)
J Appl Phys
, vol.94
, Issue.3
, pp. 1448-1453
-
-
Simpkins, B.S.1
Yu, E.T.2
Waltereit, P.3
Speck, J.S.4
-
5
-
-
0001049050
-
The role of the tunneling component in the current-voltage characteristics of metal-GaN Schottky diodes
-
Yu L.S., Liu Q.Z., Xing J., Qiao D.J., and Lau S.S. The role of the tunneling component in the current-voltage characteristics of metal-GaN Schottky diodes. J Appl Phys 84 4 (1998) 2099-2104
-
(1998)
J Appl Phys
, vol.84
, Issue.4
, pp. 2099-2104
-
-
Yu, L.S.1
Liu, Q.Z.2
Xing, J.3
Qiao, D.J.4
Lau, S.S.5
-
6
-
-
3042812300
-
Leakage mechanism in GaN and AlGaN Schottky interfaces
-
Hashizume T., Kotani J., and Hasegawa H. Leakage mechanism in GaN and AlGaN Schottky interfaces. Appl Phys Lett 84 24 (2004) 4884-4886
-
(2004)
Appl Phys Lett
, vol.84
, Issue.24
, pp. 4884-4886
-
-
Hashizume, T.1
Kotani, J.2
Hasegawa, H.3
-
7
-
-
0242468551
-
Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes
-
Huang Y., Chen X.D., Fung S., Beling C.D., and Ling C.C. Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes. J Appl Phys 94 9 (2003) 5771-5775
-
(2003)
J Appl Phys
, vol.94
, Issue.9
, pp. 5771-5775
-
-
Huang, Y.1
Chen, X.D.2
Fung, S.3
Beling, C.D.4
Ling, C.C.5
-
8
-
-
0037042102
-
Characterization of metal/GaN Schottky interfaces based on I-V-T characteristics
-
Sawada T., Ito Y., Kimura N., Imai K., Suzuki K., and Sakai S. Characterization of metal/GaN Schottky interfaces based on I-V-T characteristics. Appl Surf Sci 190 (2002) 326-329
-
(2002)
Appl Surf Sci
, vol.190
, pp. 326-329
-
-
Sawada, T.1
Ito, Y.2
Kimura, N.3
Imai, K.4
Suzuki, K.5
Sakai, S.6
-
9
-
-
1242352434
-
Analysis of reverse-bias leakage current mechanisms in GaN grown by molecular-beam epitaxy
-
Miller E.J., Yu E.T., Waltereit P., and Speck J.S. Analysis of reverse-bias leakage current mechanisms in GaN grown by molecular-beam epitaxy. Appl Phys Lett 84 4 (2004) 535-537
-
(2004)
Appl Phys Lett
, vol.84
, Issue.4
, pp. 535-537
-
-
Miller, E.J.1
Yu, E.T.2
Waltereit, P.3
Speck, J.S.4
-
10
-
-
0038646155
-
Mechanism of the reverse gate leakage in AlGaN/GaN high electron mobility transistors
-
Kamelkar S., Sathaiya D.M., and Shur M.S. Mechanism of the reverse gate leakage in AlGaN/GaN high electron mobility transistors. Appl Phys Lett 82 22 (2003) 3976-3978
-
(2003)
Appl Phys Lett
, vol.82
, Issue.22
, pp. 3976-3978
-
-
Kamelkar, S.1
Sathaiya, D.M.2
Shur, M.S.3
-
11
-
-
0032067341
-
A review of the metal-GaN contact technology
-
Liu Q.Z., and Lau S.S. A review of the metal-GaN contact technology. Solid State Electron 42 5 (1998) 677-691
-
(1998)
Solid State Electron
, vol.42
, Issue.5
, pp. 677-691
-
-
Liu, Q.Z.1
Lau, S.S.2
-
12
-
-
0036905527
-
X-ray photoemission determination of the Schottky-barrier height of metal contacts to n-GaN and p-GaN
-
Rickert K.A., Ellis A.B., Kim J.Y., Lee J.-L., Himpsel F.J., Dwikusuma F., et al. X-ray photoemission determination of the Schottky-barrier height of metal contacts to n-GaN and p-GaN. J Appl Phys 92 11 (2002) 6671-6678
-
(2002)
J Appl Phys
, vol.92
, Issue.11
, pp. 6671-6678
-
-
Rickert, K.A.1
Ellis, A.B.2
Kim, J.Y.3
Lee, J.-L.4
Himpsel, F.J.5
Dwikusuma, F.6
-
13
-
-
0030707034
-
-
Venugopalan HS, Mohney SE, Luther BP, DeLucca JM, Wolter SD, Redwing JM, et al. Phase formation and morphology in nickel and nickel/gold contacts to gallium nitride. In: Mater. Res. Soc. Symp. Proc., vol. 468; 1997. p. 431-42.
-
-
-
-
14
-
-
0001130321
-
Numerical study of electrical transport in inhomogeneous Schottky diodes
-
Osvald J. Numerical study of electrical transport in inhomogeneous Schottky diodes. J Appl Phys 85 3 (1999) 1935-1942
-
(1999)
J Appl Phys
, vol.85
, Issue.3
, pp. 1935-1942
-
-
Osvald, J.1
-
15
-
-
3342986527
-
Electron transport at metal-semiconductor interfaces: general theory
-
Tung R.T. Electron transport at metal-semiconductor interfaces: general theory. Phys Rev B 45 23 (1992) 13509-13523
-
(1992)
Phys Rev B
, vol.45
, Issue.23
, pp. 13509-13523
-
-
Tung, R.T.1
-
16
-
-
0037944289
-
Influence of inhomogeneous barrier on I-V characteristics of metal/GaN Schottky diodes
-
Sawada T., Ito Y., Imai K., Suzuki K., and Sakai S. Influence of inhomogeneous barrier on I-V characteristics of metal/GaN Schottky diodes. IPAP Conf Ser 1 (2001) 801-804
-
(2001)
IPAP Conf Ser
, Issue.1
, pp. 801-804
-
-
Sawada, T.1
Ito, Y.2
Imai, K.3
Suzuki, K.4
Sakai, S.5
-
17
-
-
20644450495
-
A modified forward I-V plot for Schottky diodes with high series resistance
-
Norde H. A modified forward I-V plot for Schottky diodes with high series resistance. J Appl Phys 50 7 (1979) 5052-5053
-
(1979)
J Appl Phys
, vol.50
, Issue.7
, pp. 5052-5053
-
-
Norde, H.1
-
18
-
-
21544463176
-
Pre-metallization processing effects on Schottky contacts to AlGaN/GaN heterostructures
-
Bradley S.T., Goss S.H., Hwang J., Schaff W., and Brillson L.J. Pre-metallization processing effects on Schottky contacts to AlGaN/GaN heterostructures. J Appl Phys 97 (2005) 084502-1-9
-
(2005)
J Appl Phys
, vol.97
-
-
Bradley, S.T.1
Goss, S.H.2
Hwang, J.3
Schaff, W.4
Brillson, L.J.5
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