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Volumn 52, Issue 2, 2008, Pages 171-174

Localised defect-induced Schottky barrier lowering in n-GaN Schottky diodes

Author keywords

Barrier lowering; Defects; Gallium nitride; I V; Leakage; Schottky barrier

Indexed keywords


EID: 38049095037     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.09.005     Document Type: Letter
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.