Simulation of rough nanostructured surfaces for ARXPS

Surface Science

Volumn 602, Issue 1, 2008, Pages 291-299

  Oswald, S ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Angle resolved XPS; Model calculations; Simulation; Surface roughness; X ray photoelectron spectroscopy

Indexed keywords

COMPUTER SIMULATION; HOMOGENIZATION METHOD; MATHEMATICAL MODELS; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY (ARXPS); MODEL CALCULATIONS; SURFACE OVERLAYERS;

NANOSTRUCTURED MATERIALS;

EID: 37549072586     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.10.015     Document Type: Article

References (21)

1. Cumpson P.J. J. Electron Spectrosc. Relat. Phenom. 73 (1995) 25
2. Oswald S., Zier M., Reiche R., and Wetzig K. Surf. Interface Anal. 38 (2006) 590
3. P.J. Cumpson, ArCtic ARXPS-Spreadsheet, Crown Copyright 1998, Version 1.0, .
4. Paynter R.W. Surf. Interface Anal. 27 (1999) 103
5. Kozlowska M., Reiche R., Oswald S., Vinzelberg H., Hübner R., and Wetzig K. Surf. Interface Anal. 36 (2004) 1600
6. Fulghum J.E., and Linton R.W. Surf. Interface Anal. 13 (1988) 186
7. Gunter P.L.J., Gijzeman O.L.J., and Niemantsverdriet J.W. Appl. Surf. Sci. 115 (1997) 342
8. Vutova K., Mladenov G., Tanaka T., and Kawabata K. Vacuum 62 (2001) 297
9. Olejnik K., Zemek J., and Werner W.S.M. Surf. Sci. 595 (2005) 212
10. Piyakis K.N., Yang D.-Q., and Sacher E. Surf. Sci. 536 (2003) 139
11. Oswald S., and Oswald F. J. Appl. Phys. 100 (2006) 104504
12. Tougaard S. J. Vac. Sci. Technol. A 21 (2003) 1081
13. Martin-Concepcion A.I., Yubero F., Espinos J.P., Garcia-Lopez J., and Tougaard S. Surf. Interface Anal. 35 (2003) 984
14. Tougaard S. J. Vac. Sci. Technol. A 23 (2005) 741
15. Werner W.S.M. Surf. Interface Anal. 23 (1995) 696
16. Zalm P.C. Surf. Interface Anal. 26 (1998) 352
17. Cumpson P.J., and Seah M.P. Surf. Interface Anal. 25 (1997) 430
18. Zier M., Oswald S., Reiche R., Kozlowska M., and Wetzig K. J. Electron Spectrosc. Relat. Phenom. 137-140 (2004) 229
19. Zier M., Oswald S., Reiche R., and Wetzig K. Appl. Surf. Sci. 252 (2005) 234
20. S. Oswald, Thin Solid Films, submitted for publication.
21. S. Oswald, F. Oswald, Surf. Interface Anal., submitted for publication.