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Volumn 90, Issue 3, 2008, Pages 457-463

Finite-element analysis of the mechanical behavior of Au/Cu and Cu/Au multilayers on silicon substrate under nanoindentation

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; FILM THICKNESS; FINITE ELEMENT METHOD; NANOINDENTATION; SEMICONDUCTING SILICON;

EID: 37549022584     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-4303-3     Document Type: Article
Times cited : (16)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.