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Volumn 54, Issue 7, 2006, Pages 1857-1862

Deformation mechanisms in TiN/(Ti,Al)N multilayers under depth-sensing indentation

Author keywords

Hardness; Multilayers; Nanoindentation; Scanning electron microscopy; Transmission electron microscopy

Indexed keywords

DEFORMATION; HARDNESS; SCANNING ELECTRON MICROSCOPY; STEEL; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33644920355     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.12.010     Document Type: Article
Times cited : (67)

References (15)
  • 4
    • 33644926592 scopus 로고
    • US Patent 4877505
    • Bergmann E. US Patent 4877505; 1989.
    • (1989)
    • Bergmann, E.1
  • 9
    • 33644894088 scopus 로고    scopus 로고
    • Sivel VGM, Alkemade PFA, Carvalho NJM, De Hosson JThM, Zandbergen HW [submitted]
    • Sivel VGM, Alkemade PFA, Carvalho NJM, De Hosson JThM, Zandbergen HW [submitted].
  • 13
    • 85040875608 scopus 로고
    • Cambridge University Press Cambridge
    • K.L. Johnson Contact mechanics 1985 Cambridge University Press Cambridge
    • (1985) Contact Mechanics
    • Johnson, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.