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Volumn 155, Issue 2-3, 2002, Pages 195-202

Characterization of Cu/Ni multilayer coatings by nanoindentation and atomic force microscopy

Author keywords

Atomic force microscopy; Cu Ni multilayer coatings; Magnetron sputtering; Mechanical properties; Nanohardness tester

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COPPER; MULTILAYERS; NICKEL;

EID: 0037124994     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00008-7     Document Type: Article
Times cited : (91)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.