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Volumn 199, Issue 1, 2005, Pages 32-37
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Application of composite hardness models to copper thin film hardness measurement
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Author keywords
Composite hardness models; Copper; Nanoindentation
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Indexed keywords
COMPOSITE MATERIALS;
COPPER;
DATA REDUCTION;
HARDNESS;
INDENTATION;
MATHEMATICAL MODELS;
OXIDATION;
SILICON;
SUBSTRATES;
THICKNESS MEASUREMENT;
COMPOSITE HARDNESS MODELS;
NANOINDENTATION;
PUCHI-CABRERA MODEL;
THIN FILM HARDNESS;
THIN FILMS;
COPPER;
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EID: 21844453372
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.04.014 Document Type: Article |
Times cited : (35)
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References (14)
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