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Volumn 199, Issue 1, 2005, Pages 32-37

Application of composite hardness models to copper thin film hardness measurement

Author keywords

Composite hardness models; Copper; Nanoindentation

Indexed keywords

COMPOSITE MATERIALS; COPPER; DATA REDUCTION; HARDNESS; INDENTATION; MATHEMATICAL MODELS; OXIDATION; SILICON; SUBSTRATES; THICKNESS MEASUREMENT;

EID: 21844453372     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.04.014     Document Type: Article
Times cited : (35)

References (14)
  • 10
    • 21844435270 scopus 로고
    • PhD Thesis, University of Cambridge
    • P.M. Sargent, PhD Thesis, University of Cambridge, 1979.
    • (1979)
    • Sargent, P.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.