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Volumn 297, Issue 1, 2006, Pages 4-6
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Growth of dilute GaSbN layers by liquid-phase epitaxy
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Author keywords
A1. Atomic force microscopy; A1. X ray diffraction; A3. Liquid phase epitaxy; A3. Semiconducting III V materials; B1. Antimonides; B2. Semiconducting gallium compounds
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
EPITAXIAL GROWTH;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIQUID PHASE EPITAXY;
POLYCRYSTALLINE MATERIALS;
SURFACE ROUGHNESS;
X RAY DIFFRACTION ANALYSIS;
ANTIMONIDES;
BAND GAP;
SEMICONDUCTING III-V MATERIALS;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 37249001661
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.09.042 Document Type: Article |
Times cited : (19)
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References (11)
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