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Volumn 297, Issue 1, 2006, Pages 4-6

Growth of dilute GaSbN layers by liquid-phase epitaxy

Author keywords

A1. Atomic force microscopy; A1. X ray diffraction; A3. Liquid phase epitaxy; A3. Semiconducting III V materials; B1. Antimonides; B2. Semiconducting gallium compounds

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIQUID PHASE EPITAXY; POLYCRYSTALLINE MATERIALS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

EID: 37249001661     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.09.042     Document Type: Article
Times cited : (19)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.