Impact of die-to-die and within-die parameter variations on the throughput distribution of multi-core processors

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2007, Pages 50-55

  Bowman, Keith A ^a   Alameldeen, Alaa R ^a   Srinivasan, Srikanth T ^a   Wilkerson, Chris B ^a  

^a INTEL CORPORATION   (United States)

Author keywords

FMAX distribution; Multi core; Parameter fluctuations; Parameter variations; Throughput distribution

Indexed keywords

FMAX DISTRIBUTION; MULTI CORE; THROUGHPUT DISTRIBUTION;

BANDWIDTH; PARAMETER ESTIMATION; STATISTICAL METHODS; SYSTEMS ANALYSIS; THROUGHPUT;

PROGRAM PROCESSORS;

EID: 36949018891     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1283780.1283792     Document Type: Conference Paper

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