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Volumn 91, Issue 23, 2007, Pages

Substrate engineering for high-performance surface-channel III-V metal-oxide-semiconductor field-effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICES; TRANSCONDUCTANCE;

EID: 36849066892     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2822892     Document Type: Article
Times cited : (55)

References (21)
  • 12
    • 36849035219 scopus 로고    scopus 로고
    • Proceedings of 65th Device Research Conference, Notre Dame, IN
    • Y. Xuan, Y. Q. Wu, H. C. Lin, T. Shen, P. D. Ye, in Proceedings of 65th Device Research Conference, Notre Dame, IN, 2007 (unpublished).
    • (2007)
    • Xuan, Y.1    Wu, Y.Q.2    Lin, H.C.3    Shen, T.4    Ye, P.D.5
  • 21


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.