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Volumn 27, Issue 12, 2006, Pages 959-962

Enhancement-mode gaAs n-channel MOSFET

Author keywords

Compound semiconductor; Enhancement mode; GaAs; High mobility channel; MOSFETs

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC CURRENTS; SEMICONDUCTING GALLIUM ARSENIDE; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

EID: 33847404778     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.886319     Document Type: Article
Times cited : (61)

References (17)
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    • (1965) Solid State Electron. , vol.8 , Issue.10 , pp. 813-823
    • Becke, H.1    Hall, R.2    White, J.3
  • 3
    • 0142020894 scopus 로고    scopus 로고
    • "Scanning tunneling microscopy and spectroscopy of gallium oxide deposition and oxidation on GaAs(001)-c(2 × 8)/(2 × 4)"
    • Oct
    • M. Hale, S. I. Yi, J. Z. Sexton, A. C. Kummel, and M. Passlack, "Scanning tunneling microscopy and spectroscopy of gallium oxide deposition and oxidation on GaAs(001)-c(2 × 8)/(2 × 4," J. Chem. Phys., vol. 119, no. 13, pp. 6719-6728, Oct. 2003.
    • (2003) J. Chem. Phys. , vol.119 , Issue.13 , pp. 6719-6728
    • Hale, M.1    Yi, S.I.2    Sexton, J.Z.3    Kummel, A.C.4    Passlack, M.5
  • 9
    • 33750587582 scopus 로고    scopus 로고
    • "Implant- free, high-mobility flatband MOSFET: Principles of operation"
    • Oct
    • M. Passlack, K. Rajagopalan, J. Abrokwah, and R. Droopad, "Implant- free, high-mobility flatband MOSFET: Principles of operation," IEEE Trans. Electron Devices, vol. 53, no. 10, pp. 2454-2459, Oct. 2006.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.10 , pp. 2454-2459
    • Passlack, M.1    Rajagopalan, K.2    Abrokwah, J.3    Droopad, R.4
  • 10
    • 0742321656 scopus 로고    scopus 로고
    • "Mobility measurement and degradation mechanism of MOSFETs made with ultrathin highκ dielectrics"
    • Jan
    • W. Zhu, J.-P. Han, and T. P. Ma, "Mobility measurement and degradation mechanism of MOSFETs made with ultrathin highκ dielectrics," IEEE Trans. Electron Devices, vol. 51, no. 1, pp. 98-105, Jan. 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , Issue.1 , pp. 98-105
    • Zhu, W.1    Han, J.-P.2    Ma, T.P.3
  • 11
    • 0016079964 scopus 로고
    • "The GaAs inversion-type MIS transistors"
    • Jul
    • T. Ito and Y. Sakai, "The GaAs inversion-type MIS transistors," Solid State Electron., vol. 17, no. 7, pp. 751-759, Jul. 1974.
    • (1974) Solid State Electron. , vol.17 , Issue.7 , pp. 751-759
    • Ito, T.1    Sakai, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.