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Volumn 78, Issue 11, 2007, Pages

Shear force control for a terahertz near field microscope

Author keywords

[No Author keywords available]

Indexed keywords

FORCE CONTROL; MICROSCOPES; NATURAL FREQUENCIES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PERMITTIVITY;

EID: 36749051263     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2804077     Document Type: Article
Times cited : (13)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.