Two-dimensional electro-optic imaging of THz beams

Applied Physics Letters

Volumn 69, Issue 8, 1996, Pages 1026-1028

  Wu, Q ^a   Hewitt, T D ^a   Zhang, X C ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CRYSTALS; DATA ACQUISITION; ELECTROOPTICAL EFFECTS; INFRARED RADIATION; LIGHT MODULATION; PHASE MEASUREMENT; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SHOT NOISE; SIGNAL TO NOISE RATIO;

ELECTROOPTIC IMAGING SYSTEMS; POCKELS EFFECT; POLARIZERS; QUARTER WAVE PHASE BIAS; TERAHERTZ BEAMS;

IMAGING SYSTEMS;

EID: 0030214773     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116920     Document Type: Article

References (9)

1. B. B. Hu and M. C. Nuss, Opt. Lett. 20, 1716 (1995).
2. M. C. Nuss, Circuits & Devices, 12, 25 (1996).
3. Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 2523 (1995); Appl. Phys. Lett. 68, 1604 (1996).
4. Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 2523 (1995); Appl. Phys. Lett. 68, 1604 (1996).
5. P. Uhd Jepsen, M. Schall, V. Schya, C. Winnewisser, S. R. Keiding, and H. Helm, Technical Digest of IX International Symposium on Ultrafast Processes in Spectroscopy, ThP38, Trieste, Italy (1995).
6. A. Nahata, D. H. Auston, and T. F. Heinz, Appl. Phys. Lett. 68, 150 (1996).
7. Q. Wu, M. Litz, and X.-C. Zhang, Appl. Phys. Lett. 68, 2924 (1996).
8. Q. Wu, F. G. Sun, P. Campbell, and X.-C. Zhang, Appl. Phys. Lett. 69, 3224 (1996).
9. M. Li, F. G. Sun, G. A. Wagoner, M. Alexander, and X.-C. Zhang, Appl. Phys. Lett. 67, 25 (1995).