Engineering variations: Towards practical single-electron (few-electron) memory

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2000, Pages 305-308

  Ishii, T ^a   Osabe, T ^a   Mine, T ^a   Murai, F ^a   Yano, K ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

QUANTUM THEORY; RANDOM PROCESSES;

SINGLE ELECTRON MEMORY;

NONVOLATILE STORAGE;

EID: 0034454561     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)