Structural studies of Ge nanocrystals embedded in SiO2 matrix

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 264, Issue 2, 2007, Pages 249-253

  Srinivasa Rao, N ^a   Dhamodaran, S ^a   Pathak, A P ^a   Kulriya, P K ^b   Mishra, Y K ^b   Singh, F ^b   Kabiraj, D ^b   Pivin, J C ^c   Avasthi, D K ^b  

^a UNIVERSITY OF HYDERABAD   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

Atom beam sputtering; Ge nanoparticles; Raman

Indexed keywords

ANNEALING; CHARACTERIZATION; COMPOSITE FILMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GERMANIUM; SILICA; SPUTTERING; X RAY DIFFRACTION;

ATOM BEAM SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROMETRY; VIBRATIONAL MODES;

NANOCRYSTALS;

EID: 36049025312     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.08.094     Document Type: Article

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