Luminescence and X-ray diffraction studies of Ge nanocrystals in amorphous silicon oxide

Materials Science and Engineering A

Volumn 286, Issue 1, 2000, Pages 161-164

  Ng, V ^a   Ng, S P ^a   Thio, H H ^a   Choi, W K ^a   Wee, A T S ^a   Jie, Y X ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Nanocrystallites; PL spectrum; SiO2

Indexed keywords

AMORPHOUS FILMS; GERMANIUM; PHOTOLUMINESCENCE; RAPID THERMAL ANNEALING; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; X RAY CRYSTALLOGRAPHY;

SILICON OXIDE;

NANOSTRUCTURED MATERIALS;

EID: 0005369029     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)00629-8     Document Type: Article

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