Structure and optical properties of SiO2 films containing Ge nanocrystallites

Surface and Coatings Technology

Volumn 161, Issue 1, 2002, Pages 92-95

  Wu, X M ^a,b   Lu, M J ^a   Yao, W G ^a  

^a SOOCHOW UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

Absorption spectrum; Ge nanocrystallites; Photoluminescence

Indexed keywords

ANNEALING; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; QUARTZ; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ABSORPTION SPECTRUM;

NANOSTRUCTURED MATERIALS;

FILM;

EID: 0036837553     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00343-2     Document Type: Article

References (13)