Double-crystal X-ray topography of freestanding HVPE grown n-type GaN

Thin Solid Films

Volumn 516, Issue 2-4, 2007, Pages 233-237

  Mahadik, Nadeemullah A ^a   Qadri, Syed B ^b   Rao, Mulpuri V ^a  

^a Krasnow Institute for Advanced Study   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Elasticity; Freestanding GaN; Topography; X ray diffraction

Indexed keywords

CRYSTALLITE SIZE; THERMAL EFFECTS; THIN FILMS; TOPOGRAPHY;

FREESTANDING GAN; X-RAY TOPOGRAPHY;

GALLIUM NITRIDE;

EID: 36048960106     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.136     Document Type: Article

References (18)

1. Nakamura S., and Fasol G. The Blue Laser Diode - GaN based Light Emitters and Lasers (1997), Springer, Berlin
2. Kahn M.A., Shur M.S., Kuznia J.N., Chen Q., Burm J., and Schaff W. Appl. Phys. Lett. 63 (1993) 1214
3. Moustakas T.D., Lei T., and Molnar R.J. Physica, B 185 (1993) 36
4. Cao X.A., Teetsov J.M., D'Evelyn M.P., Merfeld D.W., and Yan C.H. Appl. Phys. Lett. 85 (2004) 7
5. Franssen G., Grzanka S., Czernecki R., Suski T., Marona L., Riemann T., Christen J., Teisseyre H., Valvin P., Lefebvre P., Perlin P., Leszczynski M., and Grzegory I. J. Appl. Phys. 97 (2005) 103507
6. Misheva M., Larsson H., Gogova D., and Monemar B. Phys. Status Solidi, A Appl. Res. 202 (2005) 713
7. Hermann M., Gogova D., Siche D., Schmidbauer M., Monemar B., Stutzmann M., and Eickhoff M. J. Cryst. Growth 293 (2006) 462
8. Hashimoto T., Fujito K., Wu F., Haskell B.A., Fini P.T., Speck J.S., and Nakamura S. Jpn. J. Appl. Phys. 44 (2005) L797
9. Liliental-Weber Z., Chen Y., Ruvimov S., and Washburn J. Phys. Rev. Lett. 79 (1997) 2835
10. Ponce F.A., Cherns D., Young W.T., and Steeds J.W. Appl. Phys. Lett. 69 (1996) 770
11. Schwuttke G.H. J. Appl. Phys. 36 (1965) 2712
12. Gay P., Hirsch P.B., and Kelly A. Acta Metall. 1 (1953) 315
13. Hordon M.J., and Averbach B.L. Acta Metall. 9 (1961) 231
14. Qadri S.B., and Dinan J.H. Appl. Phys. Lett. 47 (1985) 1066
15. Elsner J., Jones R., Sitch P.K., Porezag V.D., Elstner M., Frauenheim Th., Heggie M.I., Öberg S., and Briddon P.R. Phys. Rev. Lett. 79 (1997) 3672
16. Scherrer P. Nachr. Gottingen 2 (1918) 98
17. Mahadik N.A., Qadri S.B., Rao M.V., and Yesinowski J.P. Appl. Phys., A 86 (2007) 67
18. Matsubara T., and Shoda K. Jpn. J. Appl. Phys. 45 (2006) 279