Depth-resolved x-ray absorption fine structure study of Fe Si interfaces using x-ray standing waves

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 19, 2007, Pages

  Gupta, Ajay ^a   Rajput, Parasmani ^a   Meneghini, Carlo ^b  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35848952525     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.195401     Document Type: Article

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