Depth profiling of marker layers using x-ray waveguide structures

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 7, 2005, Pages

  Gupta, Ajay ^a   Rajput, Parasmani ^a   Saraiya, Amit ^a   Reddy, V R ^a   Gupta, Mukul ^b   Bernstorff, Sigrid ^c   Amenitsch, H ^d  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c SINCROTRONE TRIESTE   (Italy)

^d ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644960750     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.075436     Document Type: Article

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