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Volumn 87, Issue 15, 2001, Pages

Metallic-type oscillatory interlayer exchange coupling across an epitaxial FeSi spacer

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; OSCILLATIONS; STRUCTURE (COMPOSITION); THERMAL EFFECTS; THICKNESS MEASUREMENT;

EID: 39249085521     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (65)

References (29)
  • 16
    • 0000503141 scopus 로고
    • edited by D. Briggs and M.P. Seah (John Wiley & Sons, Sussex, England); Chap. "Quantification of AES and XPS"
    • (1990) Practical Surface Analysis , vol.1 , pp. 201-255
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.