Nonlinear capacitance variations in amorphous oxide metal-insulator-metal structures

Applied Physics Letters

Volumn 91, Issue 17, 2007, Pages

  Blonkowski, S ^a  

^a STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SEMICONDUCTORS; CAPACITANCE; CAPACITANCE MEASUREMENT; MAGNETIC SUSCEPTIBILITY; TEMPERATURE DISTRIBUTION;

CAPACITANCE VARIATIONS; DIELECTRIC SUSCEPTIBILITY; NONLINEAR CAPACITANCE; TEMPERATURE DEPENDENCE;

MIM DEVICES;

EID: 35548945757     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2800291     Document Type: Article

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