Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy

Applied Physics A: Materials Science and Processing

Volumn 81, Issue 6, 2005, Pages 1207-1212

  Poyato, R ^a   Calzada, M L ^a   Shvartsman, V V ^b   Kholkin, A ^b   Vilarinho, P ^b   Pardo, L ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SUBSTRATES; SWITCHING; TEXTURES; THIN FILMS;

DOMAIN SWITCHING; NANOMETER SCALE; NANOSCALE DOMAIN; PIEZORESPONSE FORCE MICROSCOPY;

LEAD COMPOUNDS;

EID: 24144473620     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2969-3     Document Type: Article

References (29)

1. G.H. Haertling: J. Am. Ceram. Soc. 82, 797 (1999)
2. O. Auciello, J.F. Scott, R. Ramesh: Phys. Today 51, 22 (1998)
3. A. Gruverman, O. Auciello, H. Tokumoto: J. Vac. Sci. Technol. B 14, 602 (1996)
4. J.A. Christman, R.R. Woolcott, A.I. Kingon, RJ. Nemanich: Appl. Phys. Lett. 73, 3851 (1998)
5. H.R. Zeng, G.R. Li, Q.R. Yin, Z.K. Xu: Appl. Phys. A 76, 401 (2003)
6. A. Gruverman, A. Kholkin, A. Kingon, H. Tokumoto: Appl. Phys. Lett. 78, 2751 (2001)
7. A. Gruverman, H. Tokumoto, A.S. Prakash, S. Aggarwal, B. Yang, M. Wutting, R. Ramesh, T. Venkatesan: Appl. Phys. Lett. 71, 3492 (1997)
8. A. Gruverman, O. Auciello, H. Tokumoto: Appl. Phys. Lett. 69, 3191 (1996)
9. E.L. Colla, S. Hong, D.V. Taylor, A.K. Tagantsev, N. Setter, K. No: Appl. Phys. Lett. 72, 2763 (1998)
10. A. Gruverman: Appl. Phys. Lett. 75, 1452 (1999)
11. C. Yoshida, T. Tamura, K. Kondo, K. Takasaki: Appl. Phys. Lett. 79, 1339 (2001)
12. A. Roelofs, U. Böttger, R. Waser, F. Schlaphof, S. Trogisch, L.M. Eng: Appl. Phys. Lett. 77, 3444 (2000)
13. X. Chen, W. Zhu, W. Liu, Z. Wang: J. Vac. Sci. Technol. B 19, 2258 (2001)
14. X. Chen, W. Zhu, O.K. Tan, X. Yao: Mater. Chem. Phys. 75, 90 (2002)
15. R. Poyato, M.L. Calzada, L. Pardo: J. Eur. Ceram. Soc. 21, 1593 (2001)
16. R. Poyato, M.L. Calzada, L. Pardo: J. Appl. Phys. 93, 4081 (2003)
17. R. Poyato, M.L. Calzada, L. Pardo: Appl. Phys. A, DOI: 10.1007/s00339-003-2238-x (2003)
18. A.L. Kholkin, V.V. Shvartsman, A.Yu. Emelyanov, R. Poyato, M.L. Calzada, L. Pardo: Appl. Phys. Lett. 82, 2127 (2003)
19. V.V. Shvartsman, M.L. Calzada, R. Poyato, L. Pardo, A.L. Kholkin: Ferroelectrics 295, 597 (2003)
20. M.L. Calzada, M. Algueró, L. Pardo: J. Sol-Gel Sci. Technol. 13, 837 (1998)
21. K. Franke, J. Besold, W. Haessler, C. Seegebarth: Surf. Sci. Lett. 302, L283 (1994)
22. A. Gruverman, O. Auciello, H. Tokumoto: Annu. Rev. Mater. Sci. 28, 101 (1998)
23. C. Harnagea, A. Pignolet, M. Alexe, D. Hesse: Integr. Ferroelectr. 44, 113 (2002)
24. P. Paruch, T. Tybell, J.M. Triscone: Appl. Phys. Lett. 79, 530 (2001)
25. J. Mendiola, B. Jiménez, C. Alemany, L. Pardo, L. del Olmo: Ferroelectrics 94, 183 (1989)
26. M. Algueró, A.J. Bushby, M.J. Reece, R. Poyato, J. Ricote, M.L. Calzada, L. Pardo: Appl. Phys. Lett. 79, 3830 (2001)
27. R. Poyato, M.L. Calzada, J. Ricote, L. Pardo, B. Willing: Integr. Ferroelectr. 35, 77 (2001)
28. J. Ricote, R. Poyato, M. Algueró, L. Pardo, M.L. Calzada, D. Chateigner: J. Am. Ceram. Soc. 86, 1571 (2003)
29. S. Hong, J. Woo, H. Shin, J.U. Jeon, Y.E. Pak, E.L. Colla, N. Setter, E. Kim, K. No: J. Appl. Phys. 89, 1377 (2001)