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Volumn , Issue , 2007, Pages 836-841

Self-assembly process for chip-to-wafer three-dimensional integration

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECTION NETWORKS; SILICON WAFERS; THREE DIMENSIONAL COMPUTER GRAPHICS;

EID: 35348855658     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373895     Document Type: Conference Paper
Times cited : (34)

References (14)
  • 5
    • 0033329320 scopus 로고    scopus 로고
    • H. Kurino, K. W. Lee, T. Nakamura, K. Sakuma, K. T. Park, H. Shimazutsu, K. Y. Kim, K. Inamura, and M. Koyanagi, Intelligent Image Sensor Chip with Three Dimensional Structure, IEEE International Electron Devices Meeting (TEDM) Technical Digest, pp. 879-882 (1999).
    • H. Kurino, K. W. Lee, T. Nakamura, K. Sakuma, K. T. Park, H. Shimazutsu, K. Y. Kim, K. Inamura, and M. Koyanagi, "Intelligent Image Sensor Chip with Three Dimensional Structure", IEEE International Electron Devices Meeting (TEDM) Technical Digest, pp. 879-882 (1999).
  • 8
    • 0034453365 scopus 로고    scopus 로고
    • K. W. Lee, T. Nakamura, T. Ono, Y. Yamada, T. Mizukusa, H. Hashimoto, K. T. Park, H. Kurino, and M. Koyanagi, Three-Dimensional Shared Memory Fabricated Using Wafer Stacking Technology, IEEE International Electron Devices Meeting (IEDM) Technical Digest, pp. 165-168 (2000).
    • K. W. Lee, T. Nakamura, T. Ono, Y. Yamada, T. Mizukusa, H. Hashimoto, K. T. Park, H. Kurino, and M. Koyanagi, "Three-Dimensional Shared Memory Fabricated Using Wafer Stacking Technology", IEEE International Electron Devices Meeting (IEDM) Technical Digest, pp. 165-168 (2000).
  • 11
    • 4444275224 scopus 로고    scopus 로고
    • Vertical System Integration by Using InterChip Vias and Solid-Liquid Inter diffusion Bonding
    • A. Klumpp, R. Merkel, P. Ramm, J. Weber, and R. Wieland, "Vertical System Integration by Using InterChip Vias and Solid-Liquid Inter diffusion Bonding", Jap. J. Appl. Phys., 43, pp. L829-L830 (2004).
    • (2004) Jap. J. Appl. Phys , vol.43
    • Klumpp, A.1    Merkel, R.2    Ramm, P.3    Weber, J.4    Wieland, R.5
  • 12
    • 33646934683 scopus 로고    scopus 로고
    • New Three Dimensional Integration Technology Using Chip-to-Wafer Bonding to Achieve Ultimate Super-Chip Integration
    • T. Fukushima, Y. Yamada, H. Kikuchi, and M. Koyanagi, "New Three Dimensional Integration Technology Using Chip-to-Wafer Bonding to Achieve Ultimate Super-Chip Integration", Jap. J. Appl. Phys., 45, pp. 3030-3035 (2006).
    • (2006) Jap. J. Appl. Phys , vol.45 , pp. 3030-3035
    • Fukushima, T.1    Yamada, Y.2    Kikuchi, H.3    Koyanagi, M.4
  • 13
    • 33646898785 scopus 로고    scopus 로고
    • Deep-Trench Etching for Chip-to-Chip Three-Dimensional Integration Technology
    • 13
    • 13.H. Kikuchi, Y. Yamada, H. Kijima, T. Fukushima, and M. Koyanagi, "Deep-Trench Etching for Chip-to-Chip Three-Dimensional Integration Technology", Jap. J. Appl. Phys., 45, pp. 3024-3029 (2006).
    • (2006) Jap. J. Appl. Phys , vol.45 , pp. 3024-3029
    • Kikuchi, H.1    Yamada, Y.2    Kijima, H.3    Fukushima, T.4    Koyanagi, M.5
  • 14
    • 33847732625 scopus 로고    scopus 로고
    • New Three-Dimensional Integration Technology Using Self-Assembly Technique, IEEE International Electron Devices Meeting (IEDM)
    • T. Fukushima, Y. Yamada, H. Kikuchi, and M. Koyanagi, "New Three-Dimensional Integration Technology Using Self-Assembly Technique", IEEE International Electron Devices Meeting (IEDM) Technical Digest, pp. 359-362 (2005).
    • (2005) Technical Digest , pp. 359-362
    • Fukushima, T.1    Yamada, Y.2    Kikuchi, H.3    Koyanagi, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.