Atomically straight steps on vicinal Si(111) surfaces prepared by step-parallel current in the kink-up direction

Applied Physics Letters

Volumn 87, Issue 3, 2005, Pages

  Yoshida, S ^a   Sekiguchi, T ^a   Itoh, K M ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROMETER LENGTHS; MOBILE ATOMS; SILICON SURFACES; STEP-PARALLEL CURRENT;

ANNEALING; ELECTRIC CURRENTS; ELECTROMIGRATION; MICROMETERS; NANOSTRUCTURED MATERIALS; SURFACE PHENOMENA;

SEMICONDUCTING SILICON;

EID: 24144432833     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1995946     Document Type: Article

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