A seed-selection method to increase defect coverage for LFSR-reseeding-based test compression

Proceedings - 12th IEEE European Test Symposium, ETS 2007

Volumn , Issue , 2007, Pages 125-130

  Wang, Zhanglei ^a   Chakrabarty, Krishnendu ^a   Bienek, Michael ^b  

^a DUKE UNIVERSITY   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FAILURE ANALYSIS; LINEAR EQUATIONS; POLYNOMIALS; PROBLEM SOLVING;

DEFECT COVERAGE; LFSR; SEED-SELECTION METHOD; TEST COMPRESSION;

BUILT-IN SELF TEST;

EID: 34548766111     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2007.8     Document Type: Conference Paper

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