Test set enrichment using a probabilistic fault model and the theory of output deviations

Proceedings -Design, Automation and Test in Europe, DATE

Volumn 1, Issue , 2006, Pages

  Zhanglei, Wang ^a   Chakrabarty, Krishnendu ^a   Goessel, Michael ^b  

^a Duke University   (United States)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; GATES (TRANSISTOR); INTEGRATED CIRCUITS; PROBABILISTIC LOGICS;

BRIDGING FAULT MODELS; PROBABILISTIC FAULT MODELS; TEST QUALITY; TIME CONSTRAINED PRODUCTION TESTING;

ELECTRIC FAULT CURRENTS;

EID: 34047119227     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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