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Volumn , Issue , 2006, Pages 445-450

On N-detect pattern set optimization

Author keywords

[No Author keywords available]

Indexed keywords

COVERING PROBLEMS; INTEGER LINEAR PROGRAMMING; OPTIMIZATION PROBLEMS; PATTERN SET; SUBOPTIMAL SOLUTION;

EID: 84886736252     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2006.94     Document Type: Conference Paper
Times cited : (19)

References (11)
  • 1
    • 18144425772 scopus 로고    scopus 로고
    • Evaluation of the quality of n-detect scan atpg patterns on a processor
    • M. E. Amyeen, S. Venkataraman, A. Ojha and S. Lee, "Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor," Proc. of ITC, pp.669-678, 2004.
    • (2004) Proc of ITC , pp. 669-678
    • Amyeen, M.E.1    Venkataraman, S.2    Ojha, A.3    Lee, S.4
  • 3
    • 0142184765 scopus 로고    scopus 로고
    • Analyzing the effectiveness of multiple-detect test sets
    • R.D. Blanton, K.N. Dwarakanath and A.B. Shah, "Analyzing the Effectiveness of Multiple-Detect Test Sets," Proc. of ITC, pp.876-885, 2003.
    • (2003) Proc of ITC , pp. 876-885
    • Blanton, R.D.1    Dwarakanath, K.N.2    Shah, A.B.3
  • 4
    • 0345413237 scopus 로고    scopus 로고
    • Independent test sequence compaction through integer programming
    • P. Drineas and Y. Makris, "Independent Test Sequence Compaction through Integer Programming," Proc. of ICCD, pp.380-386, 2003.
    • (2003) Proc of ICCD , pp. 380-386
    • Drineas, P.1    Makris, Y.2
  • 7
    • 84893755275 scopus 로고    scopus 로고
    • A new atpg algorithm to limit test set size and achieve multiple detections of all faults
    • S. Lee, B. Cobb, J. Dworak, M.R. Grimaila and M.R. Mercer, "A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of all Faults," Proc. of DATE, pp.94-999, 2002.
    • (2002) Proc of DATE , pp. 94-999
    • Lee, S.1    Cobb, B.2    Dworak, J.3    Grimaila, M.R.4    Mercer, M.R.5
  • 8
    • 84886739304 scopus 로고    scopus 로고
    • http://groups.yahoo.com/group/lp-solve/
  • 9
    • 0029510949 scopus 로고
    • An experimental chip to evaluate test techniques experiment results
    • S.C. Ma, P. Franco and E.J. McCluskey, "An Experimental Chip to Evaluate Test Techniques Experiment Results," Proc. of ITC, pp.663-672, 1995.
    • (1995) Proc of ITC , pp. 663-672
    • Ma, S.C.1    Franco, P.2    McCluskey, E.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.